No CrossRef data available.
Article contents
More on the Calibration of TEMs
Published online by Cambridge University Press: 14 March 2018
Extract
There was a recent thread on the microscopy listserver by John McCaffrey (who hosted the discussion on TEM calibration at the 2001 M&M facility managers session) and Richard Beanland, dealing with the calibration of TEMs. This discussion was prompted by a calibration question from John Basgen, who was looking for more precision and more long-lived calibration specimens. The discussion complements and extends the one of the M&M 2001 managers meeting on EM calibration (Microscopy Today, January/February 2002, issue #02-1), and we are running this separately from that meeting discussion. (MT-ed.)
- Type
- Research Article
- Information
- Copyright
- Copyright © Microscopy Society of America 2002