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More on the Calibration of TEMs

Published online by Cambridge University Press:  14 March 2018

J. P. McCaffrey*
Affiliation:
N.R.C.
R. Beanland*
Affiliation:
Bookham Tech.

Extract

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There was a recent thread on the microscopy listserver by John McCaffrey (who hosted the discussion on TEM calibration at the 2001 M&M facility managers session) and Richard Beanland, dealing with the calibration of TEMs. This discussion was prompted by a calibration question from John Basgen, who was looking for more precision and more long-lived calibration specimens. The discussion complements and extends the one of the M&M 2001 managers meeting on EM calibration (Microscopy Today, January/February 2002, issue #02-1), and we are running this separately from that meeting discussion. (MT-ed.)

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2002