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Force Modulation Imaging

Published online by Cambridge University Press:  14 March 2018

M.G. Heaton ,
M.R. Rogers  and
CB Prater
M.G. Heaton
Affiliation:
Digital Instruments
M.R. Rogers
Affiliation:
Digital Instruments
CB Prater
Affiliation:
Digital Instruments

Extract

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Force modulation Imaging is a scanning probe microscopy (SPM) technique that identifies and maps differences in surface stiffness or elasticity. It is one of several new techniques developed as extensions to the basic SPM topographical mapping capabilities. These techniques use a variety of surface properties to better differentiate among materials where topographical differences are small or immeasurable.

Force Modulation Imaging can be used in a wide range of applications including identifying transitions between different components in composites, rubber and polymer blends, evaluating polymer homogeneity, imaging organic materials on hard substrates, detecting residual photoresist on integrated circuits, and identifying contaminants in a variety of materials.

Type
Research Article
Information
Microscopy Today , Volume 2 , Issue 6 , September 1994 , pp. 14 - 15
Copyright
Copyright © Microscopy Society of America 1994

References

1. Malvald, P, Butt, HJ, Gould, SAC, Prater, CB, Drake, B, Gurley, JA, Elings, VB, and Hansma, PK 1991 Nanotechnology 1 103.CrossRefGoogle Scholar