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Electromagnetic Simulation Optimizes Design of a Sub-20 nm Resolution Optical Microscope

Published online by Cambridge University Press:  14 March 2018

Erik J. Sanchez
Erik J. Sanchez*
Affiliation:
Portland State University, Portland, Oregon
*
[email protected]

Extract

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Recent advances in nanotechnology and nanoscience are highly dependent on our newly acquired ability to measure and manipulate individual structures on the nanoscale. A drawback of light microscopy is the fundamental limit of the attainable spatial resolution dictated by the laws of diffraction at about 250 nanometers. This diffraction limit arises from the fact that it is impossible to focus light to a spot smaller than half its wavelength. The challenge of breaking this limit has led to the development of near-field scanning optical microscopy (NSOM).

Type
Research Article
Information
Microscopy Today , Volume 14 , Issue 5 , September 2006 , pp. 28 - 31
Copyright
Copyright © Microscopy Society of America 2006

References

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