Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Scipioni, Larry
Stern, Lewis
and
Notte, John
2007.
Applications of the Helium Ion Microscope.
Microscopy Today,
Vol. 15,
Issue. 6,
p.
12.
Pease, R.F.W.
2008.
Vol. 150,
Issue. ,
p.
53.
SCHRODER, DIETER K.
2008.
NANO CHARACTERIZATION OF MATERIALS.
International Journal of High Speed Electronics and Systems,
Vol. 18,
Issue. 04,
p.
861.
Schwarzer, RA
2008.
Spatial Resolution in ACOM - What Will Come After EBSD.
Microscopy Today,
Vol. 16,
Issue. 1,
p.
34.
Suzuki, T
Kudo, M
Sakai, Y
and
Ichinokawa, T
2008.
Material Contrast of Scanning Electron and Ion Microscope Images of Metals.
Microscopy Today,
Vol. 16,
Issue. 1,
p.
6.
Thompson, William
Ogawa, Shinichi
Stern, Lewis
Scipioni, Larry
and
Notte, John
2009.
A novel helium ion microscope for interconnect material imaging.
p.
69.
Riabzev, S.V.
Veprik, A.M.
Vilenchik, H.S.
Pundak, N.
and
Castiel, E.
2009.
Vibration-free stirling cryocooler for high definition microscopy.
Cryogenics,
Vol. 49,
Issue. 12,
p.
707.
Bell, David C.
2009.
Contrast Mechanisms and Image Formation in Helium Ion Microscopy.
Microscopy and Microanalysis,
Vol. 15,
Issue. 2,
p.
147.
Kobayashi, Y.
Sugiyama, Y.
Morikawa, Y.
Kajiwara, K.
and
Hata, K.
2009.
Influence of shank shape of field ion emitter on gas molecule capture area.
p.
215.
Schwarzer, Robert A.
Field, David P.
Adams, Brent L.
Kumar, Mukul
and
Schwartz, Adam J.
2009.
Electron Backscatter Diffraction in Materials Science.
p.
1.
Scipioni, Larry
Thompson, William
Sijbrandij, Sybren
and
Ogawa, Shinichi
2009.
Material analysis with a helium ion microscope.
p.
317.
Thompson, William
Ogawa, Shinichi
Stern, Lewis
Scipioni, Larry
and
Notte, John
2009.
The helium ion microscope for interconnect material imaging.
p.
136.
Kohli, Rajiv
2009.
Review of Methods for Characterization of Microsize Dust Particles.
Vol. 1,
Issue. ,
Lemme, Max C.
Bell, David C.
Williams, James R.
Stern, Lewis A.
Baugher, Britton W. H.
Jarillo-Herrero, Pablo
and
Marcus, Charles M.
2009.
Etching of Graphene Devices with a Helium Ion Beam.
ACS Nano,
Vol. 3,
Issue. 9,
p.
2674.
Kobayashi, Y.
Sugiyama, Y.
Morikawa, Y.
Kajiwara, K.
and
Hata, K.
2010.
Experimental evaluation of the influence of shank shape of field ion emitter on the angular current density.
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena,
Vol. 28,
Issue. 2,
p.
C2A90.
Chen, Ping
Veldhoven, Emile van
Sanford, Colin A
Salemink, Huub W M
Maas, Diederik J
Smith, Daryl A
Rack, Philip D
and
Alkemade, Paul F A
2010.
Nanopillar growth by focused helium ion-beam-induced deposition.
Nanotechnology,
Vol. 21,
Issue. 45,
p.
455302.
van der Heijden, A.E.D.M.
Creyghton, Y.L.M.
van de Peppel, R.J.E.
and
Abadjieva, E.
2010.
Modification and characterization of (energetic) nanomaterials.
Journal of Physics and Chemistry of Solids,
Vol. 71,
Issue. 2,
p.
59.
Hasselbach, Franz
2010.
Progress in electron- and ion-interferometry.
Reports on Progress in Physics,
Vol. 73,
Issue. 1,
p.
016101.
Petrov, Yu. V.
Vyvenko, O. F.
and
Bondarenko, A. S.
2010.
Scanning helium ion microscope: Distribution of secondary electrons and ion channeling.
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques,
Vol. 4,
Issue. 5,
p.
792.
Cuenat, Alexandre
2010.
Fundamental Principles of Engineering Nanometrology.
p.
177.