Microscopy and Microanalysis: Volume 22 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 22 - February 2016

Physical Science Symposia

Magnetic Materials, Phenomena and Imaging at the Nanoscale

Abstract

Proposal for Magnetic Dichroism With a Standard STEM Probe Beam

Observation of an Electron Vortex Beam Created from a Self-Charging Rod

Characterization of the CoFe2O4@MnFe2O4 Magnetic Particles Using Differential Phase Contrast in STEM

Atomic Resolution andin situSTEM-EELS of Superparamagnetic Iron Oxide Nanoparticles

Tailoring magnetic nanostructures with neon in the ion microscope

4D-STEM for Quantitative Imaging of Magnetic Materials with Enhanced Contrast and Resolution

Magnetic Domain Imaging of Ni-Mn-Ga Heusler Alloys Using Lorentz TEM

Electron Energy-loss Magnetic Circular Dichroism of L10FePt Nanograins

Failure Analysis Applications of Microanalysis, Microscopy, Metallography & Fractography

Abstract

Failure Analysis of a Ruptured Cast Aluminum Alloy Fire Hose Manifold

Failure of Mountain-Anchors as Consequence of Hydrogen Embrittlement

Troubleshooting Fabricated Products via Microscopic Defect and Failure Analysis

Residue Induced Product Failures-Microanalysis

Prediction of Fatigue-Initiating Twin Boundaries in Polycrystalline Nickel Superalloys Informed by TriBeam Tomography

TEM Characterization of HSLA Steels and Welds

Combining Orientation Mapping andIn SituTEM to Investigate High-Cycle Fatigue and Failure

High-Resolution Cathodoluminescence Investigation of Degradation Processes in InGaN Green Laser Diodes

In-Situ SEM Study of Mechanical Properties of Aluminide Bond Coating at Elevated Temperature

Flex Bending Fatigue of Dental Archwires

Site-Specific Manipulation of CNTs to EXpressLO™ Grids for TEM Analysis

Temperature Dependence of Fracture Initiation in Silicon fromIn-situSEM

Microscopy and Microanalysis

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Volume 22 - February 2016

Physical Science Symposia

Magnetic Materials, Phenomena and Imaging at the Nanoscale

Abstract

Failure Analysis Applications of Microanalysis, Microscopy, Metallography & Fractography

Abstract