Microscopy and Microanalysis: Volume 22 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 22 - February 2016

Physical Science Symposia

Microscopy for Thin Films of Metals, Semiconductors and Insulators

Abstract

Observation of a Quasi-ordered Structure in Monolayer WxMo(1-x)S2Alloys

Mapping Periodic Lattice Distortions in Exfoliated Dichalchogenides with Atomic Resolution cryo-STEM

Nanoscale Mapping of Interfacial Electrical Transport in Graphene-MoS2Heterostructures with STEM-EBIC

Correlative and Multiplexed Microscopy for 2-D Chalcogenide Semiconductors

Study of Direct Lithiation of Thin Si Membranes with Spatially-Correlative Low Energy Focused Li Ion Beam and Analytical Electron Microscopy Techniques

In-situ dislocation imaging during deformation in high entropy alloys

Nano-scale characterization of L10-ordered FePt granular films for heat-assisted magnetic recording devices

Modification of Grain Boundary and Interfacial Structure in Al2O3Coatings

Steel Corrosion Mechanisms during Pipeline Operation:In SituCharacterization

Twin-assisted growth mechanism of heterogeneous interfaces between gold nanoparticles and nominally stable substrates

Nanocharacterization of Strontium Titanate Thin Films and Oxide-Electrode Interfaces in Resistive Switching Devices

Investigation of N-Polar AlGaN/GaN and InAlN/GaN Thin Films Grown by MBE

Local Strain Relaxation by A-type Dislocation Clusters in InxGal-xN/GaN Film with Indium Compositions of x = 0.07 and 0.12

Temperature Dependence of the Silicon Nitride Volume Plasmon

Microstructural characteristics of GaN/AlN thin films grown on a Si (110) substrate by molecular beam epitaxy: Transmission electron microscopy study

Bismuth Particle Formation in Annealed Dilute GaAsi-x-yPyBixAlloys

Interfacial electrical conductivity controlled crystallization of amorphous LaAlO3under electron-beam irradiation

High Temperature Stability of Amorphous Zn-Sn-O Transparent Conductive Oxides Investigated byIn SituTEM and X-ray Diffraction

Dislocation Analysis of Thermal-Cycle-Annealed Mesa-Structured HgCdTe/HgTe/CdTe/ZnTe/Si (211)

Characterizing InGaAs/GaAs quantum dots using low-kV FESEM imaging and EDS analysis at the nanometer scale

Microscopy and Microanalysis

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Volume 22 - February 2016

Physical Science Symposia

Microscopy for Thin Films of Metals, Semiconductors and Insulators

Abstract