Microscopy and Microanalysis: Volume 22 -

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Single Atom Electron Microscopy and Spectroscopy

Abstract

Single Atom Spectroscopy in Low-Dimensional Materials using Low-voltage STEM

Strain Accommodation and Coherency in Laterally-Stitched WSe2/WS2Junctions

ZnO Nanowire Supported Metal Single Atoms for CO oxidation

Quantification of the Effects of Small Mistilts on Dopant Visibility in Nanocrystals

Imaging at the Single-Atom Level in Closed-CellIn SituGas Reactions

Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20 kV

Engineering the Contrast Transfer through the Cc/Cs Corrected 20-80 kV SALVE Microscope

Correlation Averaging of Single-Atomic-Column STEM-EDX Images for Sub-Atomic Information

Atomic Resolution Studies of W Dopants Effect on the Phase Transformation of VO2

Quantitative Measurement of Intensities and Distances in Electron Microscopy

Abstract

Quantification and Sensible Correction for Energy-Loss- and Thickness-Dependent Contrast Complications in Atomic-Scale Electron Energy-Loss Spectroscopy

Misalignment Induced Artifacts in Quantitative Annular Bright-Field Imaging

Sample Tilt Effects on Atom Column Position Determination in ABF-STEM Imaging

Quantitative, Real-Space Statistical Analysis of Imperfect Lattices

Experimental Contrast of Atomically-resolved Cc/Cs-corrected 20-80kVSALVEImages of 2D-objects Matches Calculations

Quantification of ADF STEM Image Data for Nanoparticle Structure and Strain Measurements

Imaging Local Polarization and Domain Boundaries with Picometer-Precision Scanning Transmission Electron Microscopy

Distortion Correction in Scanning Transmission Electron Microcopy with Controllable Scanning Pathways

Three-Dimensional Imaging of Single La Vacancies in LaMnO3

Tracking BO6Coupling in Perovskite Superlattices to Engineer Magnetic Interface Behavior

Direct Electromagnetic Structure Observation by Aberration-corrected Differential Phase Contrast Scanning Transmission Electron Microscopy

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Single Atom Electron Microscopy and Spectroscopy

Abstract

Quantitative Measurement of Intensities and Distances in Electron Microscopy

Abstract