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Volume 11 - October 2005

Contents

Page 60 of 61

Semiconductors

Research Article

  • Electron Tomography of Microelectronic Device Interconnects

  • Q Yang, J Mardinly, C Kübel, C Nelson, C Kisielowski
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2090-2091
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Measurement of LER in Poly-Silicon Gates in MOSFETS by (S)TEM

  • J Bruley, T Kane, S Boettcher
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2092-2093
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Micro-Raman Characterization of Phase Formation and Thermal Stability of Nickel Silicide Thin Films.

  • G Conti, C Lazik, Y Uritsky
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2094-2095
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Characterization of Defect Formation during Ni Silicidation for CMOS Device Application

  • K-S Ko, S Crank, P Chen, D Yue, S Lavangkul, H Mogul, S Siddiqui, T Bonifield
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2096-2097
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • TEM Investigation of Counter-Electrode Structure in Ta Capacitors

  • P A Carvalho, D Dias, A C Ferro, W Lohwasser
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2098-2099
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Specimen Preparation for Materials Sciences

Research Article

  • A Novel Vertical Grid Transferring Technique to Prepare 3D TEM Sample from Lift-Out Sample

  • N Wang, J Wu, S Daniel
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2100-2101
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Macro Imaging Technique and How It Merges into the Digital World

  • L M Gammon
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2102-2103
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • TEM Specimen Preparation of Partially-Embedded Electrodes From Proton Exchange Membrane Fuel Cell Membrane Electrode Assemblies

  • K More, S Reeves
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2104-2105
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Preparation of Ultra-thin Carbon Supporting Film for HRTEM of Nano-particles

  • Y-M Kim, J-S Kang, J-M Jeung, Y-C Ko, Y-J Ko
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2106-2107
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Automated Sample Preparation of Low-k Dielectrics for FESEM

  • R R Cerchiara, P E Fischione, J J Gronsky, J M Matesa, A C Robins, D W Smith, S J Rozeveld, C Wood, E Beach, J Waeterloos
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2108-2109
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Novel Approaches in Microstructure Evaluation of Polymer Blends

  • N Preschilla, N Moghe, O Riccobono, S Tyagi, S Rajagopalan
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2110-2111
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Materials Research in an Aberration-Free Environment

Research Article

  • Potential, Practicalities and Problems of Aberration Minimized FESEM

  • E D Boyes
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2112-2113
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • On the Reciprocity of TEM and STEM

  • H Rose, C F Kisielowski
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2114-2115
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Imaging of Materials through Aberration Corrected STEM

  • A R Lupini, G M Veith, N J Dudney, M F Chisholm, K van Benthem, M Varela, A Y Borisevich, Y Peng, S Rashkeev, S J Pennycook
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2116-2117
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Annular Dark Field Tomography in TEM

  • S Bals, C F Kisielowski, M Croitoru, G Van Tendeloo
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2118-2119
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Atomic Resolution Electron Tomography on a Discrete Grid: Atom Count Errors

  • K J Batenburg, J R Jinschek, C F Kisielowski
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2120-2121
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Atomic Precision Measurement of Individual Atom Positions in Defects by Aberration Corrected HRTEM

  • L Houben, A Thust, K Urban
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2122-2123
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Atomic Motion Observed with the IBM Sub-Angstrom STEM

  • P E Batson
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2124-2125
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Resolution Limit Measured by Fourier Transform: 0.61 Angstrom Information Transfer through HAADF-STEM

  • Y Peng, A Y Borisevich, A R Lupini, S J Pennycook
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2126-2127
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • High Angle Annular Dark Field Imaging On and Away from the Pole

  • A Bleloch, P Wang, U Falke, P Goodhew
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2128-2129
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 60 of 61