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Volume 11 - October 2005

Contents

Page 59 of 61

Radiation Effects in Materials

Research Article

  • Effect of Electron Flux on the Electronic-excitation-induced Phase Separation in GaSb Nanoparticles

  • H Yasuda, A Tanaka, K Ishiji, H Mori
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2052-2053
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Environmental Scanning Electron Microscopic Study Of Electron Impacted High Explosive Materials

  • S K Hait, B G Polke, S Venugopalan, B R Gandhe, A S Rao
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2054-2055
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Structure Modification of PbxCa10-x(VO4)6F2 Apatite under Electron Beam Irradiation

  • Z L Dong, T J White, K Sun, L M Wang, R C Ewing
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2056-2057
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Detection of the Spontaneous Change in the Burgers Vector of Perfect Dislocation Loops in Iron

  • K Arakawa, M Hatanaka, H Mori
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2058-2059
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • In–Situ TEM of Ion Irradiated Fe–Pt Alloy Nanostructures

  • G B Thompson, N W Morgan, R C Birtcher
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2060-2061
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Radiation Damage by Ar+ Ion-Milling in Ferroelectric Oxides.

  • K Z Baba-Kishi, C W Tai
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2062-2063
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • In situ TEM Study of Electron Beam Stimulated Organization of Three-dimensional Void Superlattice in CaF2

  • T H Ding, S Zhu, L M Wang
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2064-2065
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Cavity Formation Study in SiC/SiC Composite Irradiated with Multiple-ion Beam at Elevated Temperatures

  • J–J Kai, H–T Keng, Z–H Zeng, F–R Chen
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2066-2067
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Semiconductors

Research Article

  • Zero-loss Filtered TEM Imaging of Microelectronic Structures Using In Column Filter Technology

  • H Stegmann, G Benner
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2068-2069
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • TEM Study of Oxygen Precipitation in Si Wafers with Backside Layers

  • R Yu, X F Zhang, Q Wang, M Daggubati, H Paravi
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2070-2071
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • HRTEM Study of InN Films Grown on Sapphire - Evidence for a Cubic InN Structure

  • Z Liu, R J Kinsey, S M Durbin, S P Ringer
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2072-2073
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Phase Shift of Reverse Biased p-n Junction Arrays by Fourier Methods

  • M Beleggia, P F Fazzini, G Pozzi
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2074-2075
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Strain Relaxation of GaNyAs1-y Films on (100) GaAs Substrates Studied by Transmission Electron Microscopy

  • X Wu, J-M Baribeau, J A Gupta, M Beaulieu
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2076-2077
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • TEM Characterization of Ag Precipitates in Screen Printed Ag Contacts for Si Solar Cells

  • K M Jones, Y Yan, M M Al-Jassim, M M Hilali
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2078-2079
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Scanning Electron Microscopy Cathodoluminescence Studies of Piezoelectric Fields in an InGaN Multiple Quantum Well Light-Emitting Diode

  • K L Bunker, R Garcia, P E Russell
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2080-2081
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Physical Properties of Hafnium-Silicate Transistor Gate Dielectric Stacks after Thermal Processing

  • B Foran, M Campin, M Clark, G Lian, C Johnson, G Bersuker, P Lysaght, R Rhoad
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2082-2083
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Characterization of Nanoscale Lattice Strains in Si CMOS by Convergent Beam Electron Diffraction (CBED)

  • J Huang, D K Cha, P R Chidambaram, R B Irwin, P J Jones, M J Kim
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2084-2085
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Characterization of Epitaxial Layer Defects in Silicon Wafers Using Focused Ion Beam and Transmission Electron Microscopy

  • J–H Cho, D–H Cho, C–W Lee, W–Y Kim, S–H Lim
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2086-2087
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Re-crystallisation of Amorphous Silicon in the Production of Low Defect Density Silicon on Sapphire Thin Films

  • W R McKenzie, H Domyo, T Ho, P R Munroe
  • Published online by Cambridge University Press:
    01 August 2005, pp. 2088-2089
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 59 of 61