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Microscopy and Microanalysis
Volume 11

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Microscopy and Microanalysis

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Nanostructured materials (54)

Quantitative Characterization, Simulation, and Representation of Microstructures (40)

Advances in High-Resolution Electron Microscopy: A Symposium Dedicated to the Memory of John Maxwell Cowley (38)

Breakthrough Microscopy in Catalysis, Nanoparticles and Energy (33)

High-Resolution STEM Analysis of Functional NanoMaterials (33)

Cell Pathology (32)

FIB/Dual Platform Applications and Techniques in Biological and Physical Sciences (32)

Materials Research in an Aberration-Free Environment (30)

Scanning Electron Microscopy and X-ray Microanalysis the Next 35 Years: A Symposium Celebrating Joe Goldstein's 65th Birthday (30)

Tomography in Biological and Materials Sciences (28)

Microbiology, Pathogenesis and Pathology (24)

Quantitative X-ray Microanalysis (24)

Variable Pressure Electron Microscopy: Advances in the Nanotechnology and Biomaterials Age (24)

Cryo-EM of Molecular Assemblies (22)

Advances in In-situ Electron Microsocpy Technique and Applications (21)

Failure Analysis and Prevention (21)

Materials Applications (21)

Advances in Instrumentation and Technique (20)

Botany (20)

From the Static to the Dynamic: Correlative and High Resolution Biological Imaging and Labeling (20)

Presidential Symposium: The Golden Anniversary of Imaging Atoms (20)

Scanned Probe Microscopy and Nanoanalysis: Probing Properties at the Nanoscale (20)

Biological Applications (19)

Manipulation of Microstructure to Improve Properties and Performance (19)

Metals and Alloys (19)

Magnetic and Superconducting Materials (18)

Advances in Energy-Filtered Transmission Electron Microscopy (17)

Biological Specimen Preparation (17)

Characterizing the Limits of EBSD Analysis (16)

Microanalysis of Extraterrestrial Materials: New Techniques and Applications (16)

Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Industry (16)

Scanning Electron Microscopy (SEM) (16)

Semiconductors (16)

Advanced Detectors (15)

Advances in Microstructurial Characterization Techniques (15)

Recent Progress in 3D Microscopy Imaging (14)

Spectral Imaging: Advances and Applications (14)

Advances in Ultrastructural Studies at Low Temperatures for Cryo TEM and SEM (13)

Interfaces (13)

Radiation Effects in Materials (13)

Reproduction and Development (13)

Structural Biology (13)

Biomaterials and Tissue Engineering (12)

Nano Scale Engineering & Self Assembly (12)

Vascular Corrosion Casting (12)

Modes of Cell-Cell and Cell-ECM Communication (11)

Digital Imaging (10)

Phase Transformations (10)

Green Fluorescent Protein and its Relatives (9)

Metallographic Techniques and Applications (9)

Advances in Fluorescence, Flow Cytometry and Cytomics (8)

Confocal Microscopy (8)

Microscopy and Imaging in the Digital Age (8)

Oxidation (8)

STEM Cells (8)

Films / Coatings (7)

Geology (7)

Ultrafast Electron Diffraction and Microscopy (7)

Composites (6)

Particle Analysis (6)

Specimen Preparation for Materials Sciences (6)

Technologists’ Forum: Low Temperature Technologies for Electron Microscopy (6)

Fluorescence (Förster) Resonance Energy Transfer (FRET) Microscopy (5)

Ceramics (4)

Core Facility Management (4)

Crystallography (4)

Polymers (4)

Ferroelectrics (3)

Corporate Session (2)

Industrial Real World Microscopy (2)

Building Order in Large Image Data Sets: Classification Techniques at Work! (1)

Computational Tools for Interpreting Electron Tomograms (1)

Confocal Microscopy System Performance: Spectroscopy and Foundations for Quantitation (1)

Erratum (1)

Improved Electron Microscopy with Monte Carlo Simulations (1)

In-situ Electron Microscopy: A Practical Tutorial (1)

Quantum Dots as Cellular Probes for Light and Electron Microscopy (1)

Theory and Applications of Focal-Series Reconstruction in HRTEM (1)

What is Fluctuation Electron Microscopy? (1)

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Microscopy and Microanalysis
ISSN: 1431-9276

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Volume 11 - October 2005

Contents

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Quantitative Characterization, Simulation, and Representation of Microstructures

Research Article

Three-dimensional Phase Field Simulations and Microstructural Reconstructions of Systems Undergoing Coarsening
R Mendoza, K Thornton, P W Voorhees
Published online by Cambridge University Press:

01 August 2005, pp. 1648-1649
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Quantitative Characterization of Microstructures Formed During Plastic Deformation
A Godfrey, X Huang, G Winther, Q Liu, N Hansen
Published online by Cambridge University Press:

01 August 2005, pp. 1650-1651
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Use of Statistics of Extremes for Microstructural Analysis: ASTM E2283
D Hetzner
Published online by Cambridge University Press:

01 August 2005, pp. 1652-1653
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Interlaboratory Program to Characterize Discrete Second-Phase Particles by Image Analysis
G Vander Voort
Published online by Cambridge University Press:

01 August 2005, pp. 1654-1655
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Techniques Used to Study the Effectiveness of Sintering in Ferrous Powder Metallurgy (P/M) Materials
T Murphy
Published online by Cambridge University Press:

01 August 2005, pp. 1656-1657
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Chemical Classification of Discrete Second Phases in the SEM
J J Friel
Published online by Cambridge University Press:

01 August 2005, pp. 1658-1659
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Stereological Recovery of Five-Parameter Grain Boundary Character Distributions from EBSD Maps
C-S Kim, J Gruber, G Rohrer
Published online by Cambridge University Press:

01 August 2005, pp. 1660-1661
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Quantification of Alpha Laths in Alpha/Beta Titanium Alloys
R E A Williams, T Searles, S Kar, M Uchic, D Dimiduk, H Fraser
Published online by Cambridge University Press:

01 August 2005, pp. 1662-1663
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Effect of Porosity on Ductility Variation in Investment Cast 17-4PH
D Susan, T Crenshaw, R Grant, A Kilgo, R Wright
Published online by Cambridge University Press:

01 August 2005, pp. 1664-1665
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Using Quantitative Fractography to Determinine the Influence of Carbides on Crack Path in a Directionally Solidified Superalloy
M Trexler, T Sanders
Published online by Cambridge University Press:

01 August 2005, pp. 1666-1667
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Microstructural Characterization Of Nickel-Based Superalloys
S Menon
Published online by Cambridge University Press:

01 August 2005, pp. 1668-1669
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Characterization of Gamma-Gamma Prime Interfaces in Ni Base Superalloys Subject to Creep Deformation by Conventional TEM and HREM
H A Calderon, M Benyoucef, N Clement, A Coujou, P Caron
Published online by Cambridge University Press:

01 August 2005, pp. 1670-1671
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Study of Microdispersion of Filler in Polymers by AFM Image Analysis
C C Wang, J-B Donnet, S H Wu, T K Wang
Published online by Cambridge University Press:

01 August 2005, pp. 1672-1673
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Determination of the Dissolution Curve of Gamma Prime Precipitates in Ni-base Super-Alloys through Image Analysis
T Rezende, S Paciornik
Published online by Cambridge University Press:

01 August 2005, pp. 1674-1675
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Three Dimensional Analysis of High Volume Fraction Coarsened Dendritic Microstructures
D Kammer, D A Cogswell, K Shu, P W Voorhees
Published online by Cambridge University Press:

01 August 2005, pp. 1676-1677
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

EBSD and XRM of Phases in Vacuum Cast Composite Alloys
R Wuhrer, P Huggett, K Moran, M R Phillips, B Ben-Nissan
Published online by Cambridge University Press:

01 August 2005, pp. 1678-1679
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Stereological Characterization of Structural Anisotropy of Rolled Steel
L Karlsson, L-M Cruz-Orive
Published online by Cambridge University Press:

01 August 2005, pp. 1680-1681
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Studies on Morphological Parameters of Carbides in 2.25 % Cr-1Mo Steel
V Ganesan, C B Rao
Published online by Cambridge University Press:

01 August 2005, pp. 1682-1683
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Structure of Finite-size Sigma 3 Grain Boundaries and their Interactions with Dislocations
E A Marquis
Published online by Cambridge University Press:

01 August 2005, pp. 1684-1685
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Investigation of Fly Ash Particulates Using SEM, TEM and Synchrotron Microprobe Techniques
K Smith, M Blackford, R Siegele, R Giere
Published online by Cambridge University Press:

01 August 2005, pp. 1686-1687
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

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