Microscopy and Microanalysis: Volume 21 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A06 Advanced Analytical TEM/STEM

Abstract

Revisiting Noise Scaling for Multivariate Statistical Analysis

When will low-contrast features be visible in a STEM X-ray spectrum image?

Name that Atom in 60 Seconds or Less: Energy Dispersive X-Ray Spectroscopy of Individual Heteroatoms in Low Dimensional Materials

Single Atom Detection Through HAADF-STEM and EELS/EDX Characterization of Fluorophore Ru(bpy)32+ for Optical DNA-Chip Applications

A07 Scanning Probe Microscopy: New Methods and Applications

Abstract

SFM Assisted In-Situ by ToF-SIMS: Accessing Chemical Information in True Three Dimensions

AFM Integrated with SEM/FIB for Complete 3D Metrology Measurements

Integrating Atomic Force Microscopy in Scanning Electron Microscopy

Integrated SIMS-AFM Instrument for Accurate High-Sensitivity and High-Resolution Chemical 3D Analysis

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

Quantification of Nano-inclusions by EPMA Using Conventional Accelerating Voltages

Multi-beam energy acquisition in FE-EPMA

Improvements in EPMA: Spatial Resolution and Analytical Accuracy

Improving Trace Element Analysis Precision By Not Using Off-Peak Measurements

Using EPMA, Raman LS, Hyperspectral CL, SIMS, and EBSD to Study Impact-Melt-Induced Decomposition of Zircon

A09 Advances in Combining Simulation and Experiment for Materials Design

Abstract

Quantitative Electron Microscopy and the Application by Single Electron Signals

Large-Scale Molecular Dynamics and High-Resolution Transmission Electron Microscopy Study of Graphene Grain Boundaries

Applications of Bicrystallography: Revealing Generic Similarities in Coincidence Site Lattice Boundaries of all Holohedral Cubic Materials and Facilitating the Design of 3D Printed Models of such Grain Boundaries

Defect Character at Grain Boundary Facet Junctions: A Combined HRSTEM and Atomistic Modeling Study of a Σ=5 Grain Boundary in Fe

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract

Texture and Phase Analysis in Nanocrystalline Ni Thin Films by Precession Electron Diffraction Microscopy

Application of EBSD and Precession-Enhanced Diffraction (PED) to Study Crystallography of P-Titanium Alloy During P→α Transformation under Severe Hot Plastic Deformation

Precession Electron Diffraction and Orientation Phase Mapping of Assembled Ag/ZnO Nanoantennas

Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A06 Advanced Analytical TEM/STEM

Abstract

A07 Scanning Probe Microscopy: New Methods and Applications

Abstract

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

A09 Advances in Combining Simulation and Experiment for Materials Design

Abstract

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract