Microscopy and Microanalysis: Volume 21 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 21 - August 2015

Physical Science Symposia

P02 Materials Problem Solving with Aberration-Corrected EM

Abstract

Interfacial Structure in Epitaxial Perovskite Oxides on (001) Ge Crystal

Imaging Local Polarization and Domain Boundaries in Multiferroic (LuFeO3)m/(LuFe2O4)n Superlattices

Cross-Sectional Characterization of SrTiO3/Si(001) Interfaces using Aberration-Corrected STEM

Atomic-scale Mechanisms of Defect-Induced Retention Failure in Ferroelectric Materials

Characterization of Two-Dimensional Electron Gas at the y-Al2O3/SrTiO3 Interface

P03 Advances in Microanalysis of Earth and Planetary Materials

Abstract

Atomic Scale Analysis of Terrestrial and Extra-Terrestrial Geomaterials Using Atom Probe Tomography

Correlative Transmission Electron Microscopy and Atom-Probe Tomography of an Iron Meteorite

Atomic Scale Investigation of Orthopyroxene and Olivine Grain Boundaries by Atom Probe Tomography

Quantitative microstructural analysis of geological materials by atom probe: understanding the mechano-chemical behaviour of zircon

Electron Probe Microanalysis and Microscopy: Focused Electron Beam Techniques and Applications in Characterization of Mineral Inclusions in Diamond

P04 Nano-Characterization of Low Dimensional Materials: Carbon to 2D TMDs

Abstract

Controlling Beam-Sample Interaction in Low Dimensional Materials by Low Dose Rate Electron Microscopy

Structural Rearrangement of 2-D Zeolite Nanosheets under Electron Beam

Imaging of Quantum Materials

Quantitative High Resolution Chemical Analysis of the (PbxSn1−xSe)1+δTiSe2 Intergrowth System

Long Range Order and Atomic Connectivity in Two-Dimensional Square PbSe Nanocrystal Superlattices

P05 Nuclear and Irradiated Materials: Fundamental Defect Properties

Abstract

Defect Microstructure in Irradiated Silicon Carbide

Short-Range Atomic Ordering in Amorphous Ion-Tracks in Pyrochlores

TEM Characterization of ion radiation damage in Ca(1-X)La2X/3TiO3 Perovskites

Atomic Resolution Imaging of Black Spot Defects in Ion Irradiated Silicon Carbide

P07 Metallography and Microstructural Characterization of Metals

Abstract

Application of Quantitative Metallography to Cast Nickel-Based Superalloys

Microscopy and Microanalysis

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Volume 21 - August 2015

Physical Science Symposia

P02 Materials Problem Solving with Aberration-Corrected EM

Abstract

P03 Advances in Microanalysis of Earth and Planetary Materials

Abstract

P04 Nano-Characterization of Low Dimensional Materials: Carbon to 2D TMDs

Abstract

P05 Nuclear and Irradiated Materials: Fundamental Defect Properties

Abstract

P07 Metallography and Microstructural Characterization of Metals

Abstract