Microscopy and Microanalysis: Volume 21 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A06 Advanced Analytical TEM/STEM

Abstract

Atomic resolution ptychographic phase contrast imaging of polar-ordered structures in functional oxides

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

Practical Measurement of X-ray Detection Performance of Large-Angle Silicon Drift Detectors Toward Quantitative Analysis in the Newly Developed 300 kV Aberration-Corrected Grand ARM

Characterizing Atomic Ordering of High Entropy Alloys Using Super-X EDS Characterization

Overcoming Traditional Challenges in Nano-scale X-ray Characterization Using Independent Component Analysis

Gold and Arsenopyrite Exsolution and Limits of Arsenic Solubility in Pyrite Investigated by SEM, EPMA, and L-ICPMS

Characterization of Stannous Fluoride Uptake in Human Dentine by Super-X XEDS and Dual-EELS analysis

A09 Advances in Combining Simulation and Experiment for Materials Design

Abstract

Three-Dimensional Imaging of Point Defects in Functional Materials Using Quantitative STEM

Removing Elastic Scattering Effects from Chemical Maps Taken under Incoherent Conditions

Identifying Atomic Reconstruction at Complex Oxide Interfaces Using Quantitative STEM

Revealing Unit Cell Level Distortions in Random Oxide Solid Solutions by Scanning Transmission Electron Microscopy and the Projected Pair Distribution Function

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract

Decomposing Electron Diffraction Signals in Multi-Component Microstructures

Dealing With Multiple Grains in TEM Lamellae Thickness for Microstructure Analysis Using Scanning Precession Electron Diffraction

Principles and Applications of Energy-Filtered Scanning CBED for Ferroelectric Domain Imaging and Symmetry Determination

A Statistical Dictionary Approach to Automated Orientation Determination from Precession Electron Diffraction Patterns

Correlation of Electron Diffraction between t-EBSD in the SEM, CBED in the TEM and ACOM using ASTAR in the TEM using GaN Nanowires

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

Abstract

Quest for an Optical Circuit Probe

Quantum and Time-Resolved Nano-Optics using Auto-Correlated Cathodoluminescence in a STEM

Correlative STEM-Cathodoluminescence and Low-Loss EELS of Semiconducting Oxide Nano-Heterostructures for Resistive Gas-Sensing Applications

Investigating the Origin of Luminescence in Zinc Oxide Nanostructures With STEM-Cathodoluminescence

Combined EELS and Cathodoluminescence analysis in a STEM microscope of GaN / InGaN quantum wells for LED applications

Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A06 Advanced Analytical TEM/STEM

Abstract

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

A09 Advances in Combining Simulation and Experiment for Materials Design

Abstract

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

Abstract