Microscopy and Microanalysis: Volume 21 -

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 21 - August 2015

Physical Science Symposia

P10 Microscopy and Microanalysis for Real World Problem Solving

Abstract

Spatially-Resolved EELS Analysis of Surface Chemistry of Metallic Lithium for the Development of Li-Air Battery

High Efficiency Chemical State Surface Analysis Imaging with XPS

An Analysis of the Particle Formation and Growth Process of the Nanocrystalline Diamond (NCD) Particles on Various Interlayers

Characterization of the Thickness and Distribution of Latex Coatings on Polyvinylidene Chloride Beads by Backscattered Electron Imaging

P11 Advances in Transmission Electron Microscopy and Spectroscopy of Energy Related Materials

Abstract

In Situ TEM Studies of Li and Na ion Transport and Li/Na-Induced Phase Transitions in Crystalline Materials

Electrochemical reactions in an all-solid-state Li-ion battery observed by ex situ and in situ spatially-resolved TEM EELS

In Situ Scanning Transmission Electron Microscopy (STEM) of Individual Electrochemical Intercalation Events in Graphite

Can Na+ Transport Faster Than Li+ inside Zn-Sb Intermetallic Nanomaterials?

Reaction Mechanism and Kinetic of Graphene Supported Co3O4 Nanocubes with Lithium and Magnesium Studied by in situ TEM

Technologist Forum, Tutorials and Outreach Symposia

X31 Technologists’ Forum: Safety in the Microscopy Laboratory

Abstract

Technologists’ Forum: Safety in the Microscopy Laboratory

X42 Bio Tutorial - Maximizing the Likelihood of Successful Maximum Likelihood Classification

Abstract

Large-Scale 3D Heterogeneity Analysis of CryoEM Data Using Likelihood-Based Classification in Frealign

Analytical and Instrumentation Science Symposia

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

Ultrafast Transmission Electron Microscopy with nanoscale Photoemitters

Observing Liquid Flow in Nanotubes

Ultrabright Femtosecond Electron Sources: Ultrafast Structural Dynamics in Labile Organic Crystals

Development of MeV Ultrafast Electron Scattering Instruments at SLAC National Accelerator Laboratory

A06 Advanced Analytical TEM/STEM

Abstract

Inconsistent Normalized Intensities for Quantitative STEM: Detector Scans and Single Electron Counting

Quantitative Annular Dark-Field Imaging of Single-Layer Graphene

Improving the SNR of Atomic Resolution STEM EELS & EDX Mapping while Reducing Beam-damage by using Non-rigid Spectrum-image Averaging

Correction of Linear and Nonlinear Raster Distortion from Orthogonal Image Pairs

Ptychographic Imaging in an Aberration Corrected STEM

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 21 - August 2015

Physical Science Symposia

P10 Microscopy and Microanalysis for Real World Problem Solving

Abstract

P11 Advances in Transmission Electron Microscopy and Spectroscopy of Energy Related Materials

Abstract

Technologist Forum, Tutorials and Outreach Symposia

X31 Technologists’ Forum: Safety in the Microscopy Laboratory

Abstract

X42 Bio Tutorial - Maximizing the Likelihood of Successful Maximum Likelihood Classification

Abstract

Analytical and Instrumentation Science Symposia

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

A06 Advanced Analytical TEM/STEM

Abstract