Microscopy and Microanalysis: Volume 21 -

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract

Transmission Kikuchi Diffraction (TKD)via a horizontally positioned detector

Utility of Precession Electron Diffraction Patterns with Varying Degrees of Non-parallel Illumination from the Same Nominal Sample Area

A16 Advances in Electron and Ion Scanning Microscopies

Abstract

Comparison of Secondary, Backscattered and Low Loss Electron Imaging for Dimensional Measurements in the Scanning Electron Microscope

Variation in Band Gap Contrast in Natural Molybdenum Disulphide (MoS2) with BSE Collection Angle and Stage Bias using a Segmented Annular BSED

Monte Carlo Simulations of Signal Electrons Collection Efficiency and Development of New Detectors for ESEM

Electron Microscopy in Air: Transparent Atomic Membranes and Imaging Modes

Advances In Variable Pressure Imaging and Detection

Biological Science Symposia

B04 Advances in Specimen Preparation and Correlative LM-EM (CLEM) of Biological Samples

Abstract

Quick Freeze Substitution Processing of Biological Samples for Serial Block-face Scanning Electron Microscopy

The Acquisition of Large Datasets with Serial-Block Face Scanning Electron Microscopy following Light Microscopy Image Acquisition: Workflows from Sample Preparation to Image Acquisition

In Situ Tomography of Membrane Proteins Enabled by Advanced Cryo-FIB Sample Preparation and Phase Plate Imaging

Imaging of Vitrified Biological Specimens by Confocal Cryo-Fluorescence Microscopy and Cryo-FIB/SEM Tomography

Physical Science Symposia

P01 Bringing the Real World into the Electron Microscope: Peter R. Swann Memorial Symposium on In situ TEM and STEM

Abstract

Growth of Transition Metal Oxides in Solution under Liquid Cell Electron Microscopy and Electron Beam Effects

The Stability of Gold Nanoparticles in Liquid Scanning Transmission Electron Microscopy Experiments Studied under Varied Conditions

Automated and Shaped-Controlled Liquid STEM Nanolithography

Manipulating Size and Shape of Silica Nanoparticles with Liquid-Phase Transmission Electron Microscopy

P02 Materials Problem Solving with Aberration-Corrected EM

Abstract

Materials Science Applications of Aberration Corrected TEM and/or STEM

50pm Aberration Corrected In-situ Electron Microscopy - How Ion behaves in Lithium Ion Nanowire Battery

Depth-Resolution Imaging of Crystalline Nano Clusters on/in Amorphous Films Using Aberration-Corrected TEM

Strain Control at Two-Dimensional Oxide Interfaces Probed by Aberration-Corrected STEM-EELS

P03 Advances in Microanalysis of Earth and Planetary Materials

Abstract

The Use of Auger Spectroscopy for the Elemental Analysis of Presolar Silicate Grains

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract

A16 Advances in Electron and Ion Scanning Microscopies

Abstract

Biological Science Symposia

B04 Advances in Specimen Preparation and Correlative LM-EM (CLEM) of Biological Samples

Abstract

Physical Science Symposia

P01 Bringing the Real World into the Electron Microscope: Peter R. Swann Memorial Symposium on In situ TEM and STEM

Abstract

P02 Materials Problem Solving with Aberration-Corrected EM

Abstract

P03 Advances in Microanalysis of Earth and Planetary Materials

Abstract