Microscopy and Microanalysis: Volume 21 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 21 - August 2015

Physical Science Symposia

P11 Advances in Transmission Electron Microscopy and Spectroscopy of Energy Related Materials

Abstract

Structure evolution of M02C catalysts upon exposure to oxygen

TEM and EDX Studies on the Structural and Compositional Evolution of PtNi3 Concave Nanocubes

Machine-Learning Aided Evolution Studies of Nano-composite Electrodes and Nano-particle Catalysts for Fuel Cell Applications

Atomic-scale Characterization of Restructured PtCu Nanocubes

Characterization of core/shell bi-metallic cube-shaped nanoparticles with scanning transmission electron microscopy

Crystal plane effect of CeO2 in metal-CeO2 nanocatalysts for CO oxidation

Technologist Forum, Tutorials and Outreach Symposia

X90 Microscopy in the Classroom

Abstract

Democratizing the micro-scale: A simplified, miniaturized SEM for K-12 and informal student scientists

Analytical and Instrumentation Science Symposia

A06 Advanced Analytical TEM/STEM

Abstract

What Does Quantitative Mean In Atomic-Resolution EDS STEM?

Channelling and atomic resolution STEM using X-ray emissions with absorption

Absolute-Scale Quantitative Energy Dispersive X-ray Analysis in Aberration-Corrected Scanning Transmission Electron Microscopy

Theoretical Evaluation of Atomic-Resolution X-ray Analysis toward Quantification

Quantitative EDS of Surface Modified Pd Powders for Hydrogen Storage

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

Computational Method for Composition Determination of Multilayer Epitaxial Semiconductor Structures Using Standards-Based Energy-Dispersive X-Ray Spectrometry

Practical Considerations in Quantitative Nanoscale Energy-Dispersive X-ray Spectroscopy (EDX) and Its Application in SiGe

Quantification of Phase Compositions and Diffusional Profiles in Simulated Solid-State Welds of Ti-17 via Super-X Energy-Dispersive X-Ray Spectroscopy

Effect of Specimen Geometry on Quantitative EDS Analysis with Four-Quadrant Super-X Detectors

Influence of Convergence Angle and Finite Effective Source Size for Quantitative Atomic Resolution EDXS

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract

TEM Based High Resolution Electron Diffraction Techniques for Three-dimensional Nanostructure Determination

Towards Identification of Oxygen Point Defects by Means of Position Averaged CBED

Mapping Valence Electron Distribution of Iron-Based Superconductors using Quantitative CBED and Precession Electron Diffraction

Microscopy and Microanalysis

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Volume 21 - August 2015

Physical Science Symposia

P11 Advances in Transmission Electron Microscopy and Spectroscopy of Energy Related Materials

Abstract

Technologist Forum, Tutorials and Outreach Symposia

X90 Microscopy in the Classroom

Abstract

Analytical and Instrumentation Science Symposia

A06 Advanced Analytical TEM/STEM

Abstract

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract