Microscopy and Microanalysis: Volume 21 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A06 Advanced Analytical TEM/STEM

Abstract

Dopant Quantification by Atomic-scale Energy Dispersive X-ray Analysis

Quantitative symmetry determination and symmetry mapping using convergent beam electron diffraction technique

Concentration at Detection Limit of Dopant for Semiconductor Samples Using Dual SDD Analysis System

Application of Bremsstrahlung Background Calculation and Automated Element Identification to TEM EDS Spectra

Materials Selection for Ultra-Thin Diamond-Like Carbon Film Metrology and Structural Characterization by TEM

STEM characterization of Gold-Copper anisotropic nanocrystals

EFTEM Contrast Tuning and EELS Fine Structure Analysis for Characterization of Carbon Containing Ultra-Low-k Dielectric Materials

A12 Low Voltage Electron Microscopy

Abstract

The OTO Specimen Preparation Method for Optimal Scanning Electron Microscopy Imaging of Pseudomonas aeruginosa

Thin Film and Multilayer Scintillators for Low Voltage Backscattered Electron Imaging in the Scanning Electron Microscope

Investigation of Image Contrast of Energy-Filtered BSE Image at Ultra Low Voltage

Low-Energy Electron Diffractive Imaging Based on a Single-Atom Electron Source

A13 Advancing Data Collection and Analysis for Atom Probe Tomography

Abstract

Level Set Method for Tip Shape Evolution Simulation for Atom Probe Tomography

Atom Probe Tomography Analysis of Bulk Chemistry in Mineral Standards

Atom Probe Tomography Characterization of Engineered Oxide Multilayered Structures

Creating Isoconcentration Surfaces in Low-Chemical-Partitioning, High Solute-Containing Alloys

Experimental Evaluation of Conditions Affecting Specimen Survivability in Atom Probe Tomography

Atom Probe Tomography of Zircon and Baddeleyite Geochronology Standards

Atom Probe Tomography of Feldspars and Aluminosilicate Glasses

Catalysis and Atom Probe Tomography: Recent Progresses and Future Developments towards the Analysis of Nanoporous Samples

Background Recovery through the Quantification of Delayed Evaporation Multi-Ion Events in Atom-Probe Data

Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A06 Advanced Analytical TEM/STEM

Abstract

A12 Low Voltage Electron Microscopy

Abstract

A13 Advancing Data Collection and Analysis for Atom Probe Tomography

Abstract