Microscopy and Microanalysis: Volume 21 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A06 Advanced Analytical TEM/STEM

Abstract

Avoidance of Radiation Damage in Vibrational-Mode Energy-Loss Spectroscopy

Hydrogen Analysis by Ultra-High Energy Resolution EELS

Applications of Plasmon Energy Expansion Thermometry

Aberration corrected STEM-EELS study of the hole distribution in cuprate superconductors

A11 Electron Vortex Beams and Higher-Order Beam Modes

Abstract

Holograms for the Generation of Vortex States with L=500h Fabricated by Electron Beam Lithography

Synthesization of vortex beams by combining fork-shaped gratings for transmission electron microscopy

Propagation properties of Electron Vortex Beams

Electron Singularities, Matter Wave Catastrophes, and Vortex Lattice Singularimetry

Holographic Generation of Highly Twisted Electron Beams

A12 Low Voltage Electron Microscopy

Abstract

Characterization of Advanced Nanomaterials for Lithium Ion Batteries Cathodes

Low Accelerating Voltage X-ray Microanalysis - Strategies and challenges

Advantages of Beam Deceleration for Low kV EDS Analysis

Nanostructures Viewed through Low Voltage Electron Microscopy

A13 Advancing Data Collection and Analysis for Atom Probe Tomography

Abstract

Nanoscale Characterization of Li-ion Battery Cathode Nanoparticles by Atom Probe Tomography Correlated with Transmission Electron Microscopy and Scanning Transmission X-Ray Microscopy

Integrated APT/t-EBSD for Grain Boundary Analysis of Thermally Grown Oxide on a Ni-Based Superalloy

A Comparative Analysis of a Si/SiGe Heterojunction-Bipolar Transistors: APT, STEM-EDX and ToF-SIMS

CdSe1_xTex Phase Segregation in CdSe/CdTe Based Solar Cells

Dopant and Interfacial Analysis of Epitaxial CdTe Using Atom Probe Tomography

In-Situ Deuterium Charging for Direct Detection of Hydrogen in Vanadium by Atom Probe Tomography

A16 Advances in Electron and Ion Scanning Microscopies

Abstract

High-Throughput SEM via Multi-Beam SEM: Applications in Materials Science

Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A06 Advanced Analytical TEM/STEM

Abstract

A11 Electron Vortex Beams and Higher-Order Beam Modes

Abstract

A12 Low Voltage Electron Microscopy

Abstract

A13 Advancing Data Collection and Analysis for Atom Probe Tomography

Abstract

A16 Advances in Electron and Ion Scanning Microscopies

Abstract