Digital Imaging and Adobe Photoshop (Organized by J. Mackenzie)
Inside Adobe Photoshop and Acrobat
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- 02 July 2020, pp. 830-831
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Image Processing Methodology for Determining SI Precipitate Size and Density in Oxide Layers from Conical Dark Field TEM Micrographs
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- 02 July 2020, pp. 832-833
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Quantitative Microscopy for Analysis of Hydrogel Pore Structure
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- 02 July 2020, pp. 834-835
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Applications of Dispersion Staining Technique in Image Analysis of Colorless Particles
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- 02 July 2020, pp. 836-837
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Ask the Experts: Addressing Issues in Digital Imaging for the Microscopist (Organized by J. Mascorro, R. Anderson and D. Sherman)
Placing TEM Negative Images into the Digital Domain
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- 02 July 2020, pp. 838-839
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Hybrid Imaging in Electron Microscopy
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- 02 July 2020, pp. 840-841
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Color Management System
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- 02 July 2020, pp. 842-843
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From Digital Imaging to the Publisher: Navigating the Digital Journey
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- 02 July 2020, pp. 844-845
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Telemicroscopy in Pathology Diagnosis
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- 02 July 2020, pp. 846-847
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Can Scanning Probe Microscopes Do Microanalysis?(Organized by I. Holl Musselman)
Investigation of The Self-Assembly of Chiral Molecules At Liquidsolid Interfaces Using Scanning Tunneling Microscopy Chemical Marker Groups: Driving Forces for 2-D Separation of Chiral Species
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- 02 July 2020, pp. 848-849
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Can Scanning Probe Microscopes Do Microanalysis? (Organized by I. Holl Musselman)
Functional Group Contrast in Scanning Tunneling Microscopy Images of Substituted Phenylethers
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- 02 July 2020, pp. 850-851
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Proximal Probe Microscopes: tools for Nanotechnology
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- 02 July 2020, pp. 852-853
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Noninvasive Probing of Redox Reactions in Single Living Cells by Scanning Electrochemical Microscopy (SECM)
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- 02 July 2020, pp. 854-855
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Solvent Isotope Effects in Atomic Force Spectroscopy
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- 02 July 2020, pp. 856-857
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Real-Time Observation of Phospholipid Bilayer Membrane Restructuring Induced by Protein Molecules using Atomic Force Microscopy
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- 02 July 2020, pp. 858-859
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Single Molecule Force Spectroscopy Maps to Study Receptors Clustering
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- 02 July 2020, pp. 860-861
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Quantifying Molecular Forces: Sensitivities and Spring Constants Without Touching a Surface
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- 02 July 2020, pp. 862-863
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Observation of Contact Potential Difference (CPD) on Semiconducter Surface using Ultrahigh Vacuum Scanning Kelvin Probe Force Microscope (UHV SKPM)
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- 02 July 2020, pp. 864-865
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Observation of Magnetic Film Using Magnetic Force Microscope (MFM) in Ultra-High Vacuum (UHV)
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- 02 July 2020, pp. 866-867
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Corporate Session (Organized by M. Kersker)
New Concept in Helium Cooled Transmission Microscopes Philips Tecnai F30 Helium: Design and First Results
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- 02 July 2020, pp. 868-869
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