Microscopy and Microanalysis: Volume 21 - Proceedings of Microscopy & Microanalysis 2015

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A03 Electron Holography for Nanofields in Solids

Abstract

Strain Measurement through the Thickness of Crystal using DBI

Elastic Relaxation of Strained Silicon on Insulator (sSOI) Fins: Nanobeam Diffraction (NBD) and Simulations

Electrostatic-Potential Analysis of Charged Particles by Split-Illumination Electron Holography

Crystalline Phase Mapping Associated to the Magnetic Flux in Cobalt Nanowires

New Quantitative Phase Reconstruction Technique using Hollow-cone Probe and Annularly Arrayed Detectors in STEM

Analysis of GaAs Compound Semiconductors and the Semiconductor Laser Diode using Off-Axis Electron Holography, Lorentz Microscopy, Electron Diffraction Microscopy and Differential Phase Contrast STEM

Three Dimensional Visualization of Electromagnetic Fields from One Dimensional Nanostructures

A04 Advances in FIB: New Instrumentation and Applications in Materials and Biological Sciences

Abstract

Progression of Focused Helium Ion Beam Milling in Gold Substrates

Investigation of Ar Ion-Milling Rates for Transmission Electron Microscopy Specimens

Focused Ion Beam Micromachining Enables Novel Optics for X-ray Microscopy

In Situ Probing Biological Structures by Combining Focused Ion Beam and Atomic Force Microscopy

Multilayer Fresnel Zone Plates for X-ray Microscopy

FIB-assisted TEM Sample Preparation Refinement Using TRIM Simulations

Utilization of FIB Technique in TEM Specimen Preparation of GaN-based Devices for Dislocation Investigation

Nano and Microscale Patterning on Soft Matters with Ion Beam Irradiation

Xe Plasma FIB-SEM with Improved Resolution of Both Ion and Electron Columns

Superconducting Nano Wire Circuits Fabricated using a Focused Helium Beam

Manipulations of Submicro-fibers of Culex Pipiens with the Help of Nano-tweezers with Shape Memory Effect into Vacuum Chamber of FIB

Advantages of using Plasma FIB Over a Gallium LMIS Source

Large volume 3D characterization by plasma FIB DualBeam microscopy

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A03 Electron Holography for Nanofields in Solids

Abstract

A04 Advances in FIB: New Instrumentation and Applications in Materials and Biological Sciences

Abstract