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Volume 11 - Issue S02 - August 2005

Contents

Page 14 of 54

Characterizing the Limits of EBSD Analysis

Research Article

  • Energy-dependence of an EBSD Pattern

  • A Deal, A Eades
  • Published online by Cambridge University Press:
    01 August 2005, pp. 524-525
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Optimizing the EBSD Signal

  • A Deal, A Eades
  • Published online by Cambridge University Press:
    01 August 2005, pp. 526-527
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Dynamic Background Correction of Electron Backscatter Diffraction Patterns

  • D J Dingley, S I Wright, M M Nowell
  • Published online by Cambridge University Press:
    01 August 2005, pp. 528-529
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Advances in High-Resolution Electron Microscopy: A Symposium Dedicated to the Memory of John Maxwell Cowley

Research Article

  • Progress and Perspectives for Atomic-Resolution Electron Microscopy

  • D J Smith
  • Published online by Cambridge University Press:
    01 August 2005, pp. 530-531
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Electron Nanocrystallography - Solving Small Crystal Structures by TED

  • J C H Spence, J S Wu
  • Published online by Cambridge University Press:
    01 August 2005, pp. 532-533
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Pyramidal Defects in GaN:Mg Grown With Ga Polarity

  • Z Liliental-Weber, T Tomaszewicz, D Zakharov, M A O'Keefe
  • Published online by Cambridge University Press:
    01 August 2005, pp. 534-535
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Combining Nanoprobes and the Electron Microscope — Challenges and Opportunities

  • L-M Peng, Q Chen, J Y Wang, M S Wang, C H Jin, S Wang
  • Published online by Cambridge University Press:
    01 August 2005, pp. 536-537
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • High Resolution Electron Microscopy Studies of Polar Oxide Interfaces

  • M Gajdardziska-Josifovska, V K Lazarov
  • Published online by Cambridge University Press:
    01 August 2005, pp. 538-539
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Resolution Quality and Atom Positions in Sub-Ångström Electron Microscopy

  • M A O'Keefe, L F Allard, D A Blom
  • Published online by Cambridge University Press:
    01 August 2005, pp. 540-541
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Magnesium Sulfate: A Dual-Scattering Unconventional Negative Stain

  • W H Massover
  • Published online by Cambridge University Press:
    01 August 2005, pp. 542-543
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • An Aberration-Corrected STEM for Diffraction Studies

  • O L Krivanek, N Dellby, A McManama-Smith, M Murfitt, P D Nellist, C S Own
  • Published online by Cambridge University Press:
    01 August 2005, pp. 544-545
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Is there a Road Map of Aberration Correction towards Ultra-High Rsolution in TEM and STEM?

  • M Haider, H Mueller
  • Published online by Cambridge University Press:
    01 August 2005, pp. 546-547
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • High Resolution Imaging with an Aberration Corrected JEOL 2200FS-AC STEM/TEM

  • D A Blom, L F Allard, M A O'Keefe, S Mishina
  • Published online by Cambridge University Press:
    01 August 2005, pp. 548-549
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Direct Imaging of Point Defects in a Quasicrystal by Cs-Corrected Ultrahigh-Resolution 300kV-STEM

  • E Abe, S J Pennycook
  • Published online by Cambridge University Press:
    01 August 2005, pp. 550-551
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Calibration of Projector Lens Distortions for Quantitative High-Resolution TEM

  • F Hue, C L Johnson, S Lartigue-Korinek, G Wang, P R Buseck, M J Hytch
  • Published online by Cambridge University Press:
    01 August 2005, pp. 552-553
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Phonon Scattering in High-Resolution Electron Microscopy

  • C B Boothroyd
  • Published online by Cambridge University Press:
    01 August 2005, pp. 554-555
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Statistical Estimation of Oxygen Atomic Positions with Sub Ångstrom Precision from Exit Wave Reconstruction

  • S Bals, S Van Aert, G Van Tendeloo, D Van Dyck, D Ávila-Brande
  • Published online by Cambridge University Press:
    01 August 2005, pp. 556-557
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Structure Determination of Isolated Single-Walled Carbon Nanotubes by Electron Diffraction and Diffraction Microscopy

  • T Beetz, L Wu, Y Zhu
  • Published online by Cambridge University Press:
    01 August 2005, pp. 560-561
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Measuring Local Thickness Through Small-Tilt Fringe Visibility

  • E Mandell, P Fraundorf, W Qin
  • Published online by Cambridge University Press:
    01 August 2005, pp. 562-563
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 14 of 54