Microscopy and Microanalysis: Volume 23 - Proceedings of Microscopy & Microanalysis 2017

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Physical Science Symposia

TEM/STEM/EELS/SNOM of Ultralow Energy Excitations

Abstract

Monochromated EELS and Optical Spectroscopy of Layered Carbon Nitrides

Advanced Microscopy and Microanalysis of Complex Oxides

Abstract

Imaging Point Defects in Complex Oxides Using Quantitative STEM

Influence of Substrate Temperature and Dopant Distribution at Two-Dimensionally Doped Superconducting La2CuO4 Interfaces

Bayesian Statistical Model for Imaging of Single La Vacancies in LaMnO3

Utilizing Atom Probe Tomography for 3-D Quantification of Point Defects

Dissecting Electronic Structure of a New Line Defect in NdTiO3 by EELS

Probing Disorder in MBE-grown Oxide Films Using Quantitative STEM

Oxide Epitaxy with Large Symmetry Mismatch: Bronze-phase VO2 on SrTiO3

Compositional Ordering and Polar Nano-Regions: Physical Effects of Sn Alloying in SrTiO3 Thin Films

Identification and Quantification of Boron Dopant Sites in Antiferromagnetic Cr2O3 Films by Electron Energy Loss Spectroscopy

Interfacial Coupling and Polarization of Perovskite ABO3 Heterostructures

ELNES spectrum unmixing and mapping for oxide/oxide interfaces.

Identifying Novel Polar Distortion Modes in Engineered Magnetic Oxide Superlattices

High Resolution Studies of Oxide Multiferroic Interfaces in the Aberration-Corrected STEM

Interface and Surface Local Atomic Structures of Lithium Ion Battery Oxides

Utilizing High-temperature Atomic-resolution STEM and EELS to Determine Reconstructed Surface Structure of Complex Oxide

Aberration-corrected STEM Imaging and EELS Mapping of BaTiO3/SrTiO3 Interfacial Defects

Combined EELS and XAS Analysis of the Relationship between Depth Dependence and Valence in LSMO Thin Films

Probing the Electronic Structure of BaSnO3 by EELS Analysis and ab initio Calculations

Interaction between Ferroelectric Polarization and Defects in BiFeO3 Thin Films

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Physical Science Symposia

TEM/STEM/EELS/SNOM of Ultralow Energy Excitations

Abstract

Advanced Microscopy and Microanalysis of Complex Oxides

Abstract