Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-24T13:25:15.846Z Has data issue: false hasContentIssue false
  • English
  • Français

ZEISS Crossbeam - Advancing Capabilities in High Throughput 3D Analysis and Sample Preparation

Published online by Cambridge University Press:  04 August 2017

Tobias Volkenandt ,
Fabian Perez-Willard ,
Michael Rauscher  and
Pascal Maria Anger
Tobias Volkenandt
Affiliation:
Carl Zeiss Microscopy GmbH, Carl-Zeiss Str. 22, 73447 Oberkochen, Germany
Fabian Perez-Willard
Affiliation:
Carl Zeiss Microscopy GmbH, Carl-Zeiss Str. 22, 73447 Oberkochen, Germany
Michael Rauscher
Affiliation:
Carl Zeiss Microscopy GmbH, Carl-Zeiss Str. 22, 73447 Oberkochen, Germany
Pascal Maria Anger
Affiliation:
Carl Zeiss Microscopy, LLC, One Zeiss Drive, Thornwood, NY 10594, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 8 - 9
Copyright
© Microscopy Society of America 2017