Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-25T08:34:56.905Z Has data issue: false hasContentIssue false
  • English
  • Français

Z-contrast imaging as a tool for atomic level analysis of bimetallic structures

Published online by Cambridge University Press:  25 July 2016

M. Cem Akatay ,
Sergio I. Sanchez  and
Steven A. Bradley
M. Cem Akatay
Affiliation:
UOP LLC, A Honeywell Company
Sergio I. Sanchez
Affiliation:
UOP LLC, A Honeywell Company
Steven A. Bradley
Affiliation:
UOP LLC, A Honeywell Company

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 864 - 865
Copyright
© Microscopy Society of America 2016 

References

[1] Krivanek, O.L., et al., Nature 464 (2010) 571–574.CrossRefGoogle Scholar
[2] LeBeau, , et al, Ultramicroscopy (2008) 108, 1653–1658.Google Scholar
[3] Yang, , et al., Materials Characterization (2003) 51, 101–107.Google Scholar
[4] Ortalan, , et al., Nature Nanotechnology 5, 843–847, 2010.Google Scholar
[5] Browning, , et al., ChemCatChem (2013) 5, 2673–2683.Google Scholar
[6] Akatay, , et al., Microscopy and Microanalysis (2015) 21(S3), 641–642.Google Scholar