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X-ray Spectrum Imaging at High Resolution in the STEM and STEM/SEM and SEM

Published online by Cambridge University Press:  01 August 2018

James Sagar ,
Dylan Wood ,
Philippe Pinard ,
Jane Howe ,
James Holland ,
Simon Burgess  and
Peter Statham
James Sagar
Affiliation:
Oxford Instruments Nanoanalysis, High Wycombe, United Kingdom.
Dylan Wood
Affiliation:
Oxford Instruments Inc., Concord, USA.
Philippe Pinard
Affiliation:
Oxford Instruments Nanoanalysis, High Wycombe, United Kingdom.
Jane Howe
Affiliation:
Hitachi High-Technologies America Inc., Clarksburg, USA.
James Holland
Affiliation:
Oxford Instruments Nanoanalysis, High Wycombe, United Kingdom.
Simon Burgess
Affiliation:
Oxford Instruments Nanoanalysis, High Wycombe, United Kingdom.
Peter Statham
Affiliation:
Oxford Instruments Nanoanalysis, High Wycombe, United Kingdom.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 656 - 657
Copyright
© Microscopy Society of America 2018 

References

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[3] Chen, Z., et al, Ultramicroscopy 176 2017) p. 52.Google Scholar
[4] Ritchie, N. W. M. Surface and Interface Analysis 37 2005) p. 1006.Google Scholar