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XPS and FESEM/STEM Surface Characterization of Activated Carbon, Carbon Black, and Carbon Nanotubes

Published online by Cambridge University Press:  01 August 2010

BR Strohmeier
Affiliation:
RJ Lee Group, Inc
JD Piasecki
Affiliation:
RJ Lee Group, Inc
KL Bunker
Affiliation:
RJ Lee Group, Inc
JL Sturgeon
Affiliation:
RJ Lee Group, Inc
BA Stitch
Affiliation:
RJ Lee Group, Inc
JP Marquis Jr
Affiliation:
RJ Lee Group, Inc

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2010