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XEDS and EELS in the TEM at Atmospheric Pressure and High Temperature

Published online by Cambridge University Press:  23 September 2015

Eric Prestat
Affiliation:
School of Materials, University of Manchester, Manchester, M13 9PL, UK
Matthew Smith
Affiliation:
School of Materials, University of Manchester, Manchester, M13 9PL, UK
Arne Janssen
Affiliation:
School of Materials, University of Manchester, Manchester, M13 9PL, UK
Thomas J. A. Slater
Affiliation:
School of Materials, University of Manchester, Manchester, M13 9PL, UK
Pedro H. C. Camargo
Affiliation:
Instituto de Quimica, Universidade de Sao Paulo, Sao Paulo 05508-000, Brazil
Matthew A. Kulzick
Affiliation:
BP Corporate Research Center, Naperville, IL 60563, USA
M. Grace Burke
Affiliation:
School of Materials, University of Manchester, Manchester, M13 9PL, UK
Sarah J. Haigh
Affiliation:
School of Materials, University of Manchester, Manchester, M13 9PL, UK
Nestor J. Zaluzec
Affiliation:
School of Materials, University of Manchester, Manchester, M13 9PL, UK Electron Microscopy Center, NST Division, Argonne National Laboratory, Argonne, USA.

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Giorgio, S., et al., Ultramicroscopy 106 (2006). p 503.Google Scholar
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[3] Chenna, S. & Crozier, P., Microsc. Microanal. 17(Suppl 2) (2011). p 476.CrossRefGoogle Scholar
[4] Crozier, P. & Chenna, S., Ultramicroscopy 111 (2011). p 177.Google Scholar
[5] Zaluzec, N. J., et al., Microsc. Microanal. 20 (2014). p 323.Google Scholar
[6] Research supported by EPSRC Grants #EP/G035954/1 and EP/J021172/1, the DTR Agency Grant HDTRA1-12-1-003, the BP Innovation Fund and ICAM project at Manchester U.S. DoE, Office of Science, Contract No. DE-AC02-06CH11357 at Argonne National Laboratory.Google Scholar