Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-24T11:55:21.686Z Has data issue: false hasContentIssue false
  • English
  • Français

The “WOW Factor”: Using Scanning Electron Microscopy to Stimulate Interest in STEM Disciplines

Published online by Cambridge University Press:  25 July 2016

N.A. Butkevich  and
M. Gury
N.A. Butkevich
Affiliation:
Biology Department, Schoolcraft College, Livonia, MI United States
M. Gury
Affiliation:
Sciences Division, Schoolcraft College, Livonia, MI United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 2086 - 2087
Copyright
© Microscopy Society of America 2016