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Windowless, Silicon Nitride window and Polymer window EDS detectors: Changes in Sensitivity and Detectable Limits

Published online by Cambridge University Press:  23 September 2015

J. Rafaelsen ,
T. Nylese ,
M. Bolorizadeh  and
V. Carlino
J. Rafaelsen
Affiliation:
EDAX Inc, A division of Ametek, Materials Analysis Division, 91 McKee Drive, Mahwah, NJ 07430USA
T. Nylese
Affiliation:
EDAX Inc, A division of Ametek, Materials Analysis Division, 91 McKee Drive, Mahwah, NJ 07430USA
M. Bolorizadeh
Affiliation:
EDAX Inc, A division of Ametek, Materials Analysis Division, 91 McKee Drive, Mahwah, NJ 07430USA
V. Carlino
Affiliation:
ibss Group INC, 1559B Sloat Blvs., Suite 270, San Francisco, Ca 94132USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1645 - 1646
Copyright
Copyright © Microscopy Society of America 2015 

References

1. Precision and Sensitivity in Electron Microprobe Analysis Ziebold, Thomas O. 8 1967). Analytical Chemistry Vol. 39, pp. 858–861.Google Scholar
2. Goldstein, ■, et al, Scanning Electron Microscopy andX-Ray Microanalysis (s.1., Plenum Press, New York (1984) . ISBN 0-306-40768-X.Google Scholar
3. Improved Carbon Analysis with Evactron Plasma Cleaning Rolland, P., Carlino, V. & Vane, R., S02, s.l. : Microscopy Society of America (2004) . Microscopy and Microanalysis Vol. 10, pp. 964–965x.Google Scholar