Hostname: page-component-78c5997874-8bhkd Total loading time: 0 Render date: 2024-11-09T15:09:48.589Z Has data issue: false hasContentIssue false
  • English
  • Français

Windowless, Silicon Nitride window and Polymer window EDS detectors: Changes in Sensitivity and Detectable Limits

Published online by Cambridge University Press:  23 September 2015

J. Rafaelsen ,
T. Nylese ,
M. Bolorizadeh  and
V. Carlino
J. Rafaelsen
Affiliation:
EDAX Inc, A division of Ametek, Materials Analysis Division, 91 McKee Drive, Mahwah, NJ 07430USA
T. Nylese
Affiliation:
EDAX Inc, A division of Ametek, Materials Analysis Division, 91 McKee Drive, Mahwah, NJ 07430USA
M. Bolorizadeh
Affiliation:
EDAX Inc, A division of Ametek, Materials Analysis Division, 91 McKee Drive, Mahwah, NJ 07430USA
V. Carlino
Affiliation:
ibss Group INC, 1559B Sloat Blvs., Suite 270, San Francisco, Ca 94132USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1645 - 1646
Copyright
Copyright © Microscopy Society of America 2015 

References

1. Precision and Sensitivity in Electron Microprobe Analysis Ziebold, Thomas O. 8 1967). Analytical Chemistry Vol. 39, pp. 858–861.Google Scholar
2. Goldstein, ■, et al, Scanning Electron Microscopy andX-Ray Microanalysis (s.1., Plenum Press, New York (1984) . ISBN 0-306-40768-X.Google Scholar
3. Improved Carbon Analysis with Evactron Plasma Cleaning Rolland, P., Carlino, V. & Vane, R., S02, s.l. : Microscopy Society of America (2004) . Microscopy and Microanalysis Vol. 10, pp. 964–965x.Google Scholar