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Win X-ray, The Monte Carlo Program for X-ray Microanalysis in the Scanning Electron Microscope

Published online by Cambridge University Press:  06 August 2003

Raynald Gauvin ,
Eric Lifshin ,
Hendrix Demers ,
Paula Horny  and
Helen Campbell
Raynald Gauvin
Affiliation:
Department Metals and Materials Engineering, McGill University, Montréal, Québec, Canada, H3A 2B2
Eric Lifshin
Affiliation:
Albany Institute for Materials, CESTM, 251 Fuller Road, Albany, NY, 12301, USA
Hendrix Demers
Affiliation:
Department Metals and Materials Engineering, McGill University, Montréal, Québec, Canada, H3A 2B2
Paula Horny
Affiliation:
Department Metals and Materials Engineering, McGill University, Montréal, Québec, Canada, H3A 2B2
Helen Campbell
Affiliation:
Department Metals and Materials Engineering, McGill University, Montréal, Québec, Canada, H3A 2B2

Abstract

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Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 32 - 33
Copyright
Copyright © Microscopy Society of America 2003