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Why does the hkl: h+k+l = 4n+2 reflections reveal intensity in Si [110]?

Published online by Cambridge University Press:  01 August 2002

P. Geuens ,
C.B. Carter  and
D. Van Dyck
P. Geuens
Affiliation:
EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium
C.B. Carter
Affiliation:
Dept. Ch. E. & Materials Science, University of Minnesota, Minneapolis, USA
D. Van Dyck
Affiliation:
EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium

Abstract

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Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 662 - 663
Copyright
Copyright © Microscopy Society of America 2002