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What Do We Need to Look Out for When Doing Energy Dispersive Xray Analysis in the Environmental Scanning Electron Microscope?

Published online by Cambridge University Press:  02 July 2020

Scott Wight
Scott Wight*
Affiliation:
National Institute of Standards and Technology100 Bureau Dr. STOP 8371, Gaithersburg, MD20899-8371
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Extract

The environmental scanning electron microscope (ESEM) is not typically used for quantitative analysis by energy dispersive x-ray spectrometry (EDS) because the electron beam is scattered by the chamber gas forming a broad tail or skirt rather than a focused spot. Scattered electrons can contribute x-rays from areas not directly under the beam, which compromises the spectrum for quantitative analysis. For specimens compatible with high vacuum, quantitative EDS analysis in a conventional electron microscope is preferred. However, the ESEM has found its niche in providing a vehicle for investigating those specimens that for any of a variety of reasons are not suitable for high vacuum electron microscopy and microanalysis. For these specimens, it is important that we find the most accurate way to perform EDS analysis in the low vacuum environment.

Research has focused on reducing, accounting for, predicting, or measuring the electron scattering on a simplified system. Instrumental tricks to reduce the scattering of the primary electron beam have been reported in the past.

Type
Environmental Scanning Electron Microscopy and Other Wet Work
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 290 - 291
Copyright
Copyright © Microscopy Society of America

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References

references

1. Certain commercial software, equipment, instruments, or materials are identified in this report to specify adequately the experimental procedure. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the materials or equipment identified are necessarily the best available for the purpose.Google Scholar
2.Wight, S.A., Microscopy and Microanalysis 1996, (1996)838.CrossRefGoogle Scholar
3.Griffin, B.J. and Nockolds, C.E., Microscopy and Microanalysis 1996, (1996)842.CrossRefGoogle Scholar
4.Doehne, E., SCANNING, 19(1997)75.CrossRefGoogle Scholar
5.Joy, D. C., Microscopy and Microanalysis 1996, (1996)836.CrossRefGoogle Scholar
6.Bache, I.C.et al., Microscopy and Microanalysis, Supp 2, 3(1997)1211.CrossRefGoogle Scholar
7.Wight, S.A., Microscopy and Microanalysis, Supp 2, 4(1998)298.CrossRefGoogle Scholar
8.Roberson, S.et al., Microbeam Analysis 1995, (1995)225.Google Scholar
9.Stowe, S.J. and Robinson, V.N.E., SCANNING, 20(1998)57.CrossRefGoogle Scholar