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Wear of Si Cantilever Tips used in Atomic Force Acoustic Microscopy

Published online by Cambridge University Press:  01 August 2005

R H Geiss ,
M Kopycinska-Müller  and
D C Hurley
R H Geiss
Affiliation:
National Institute of Standards and Technology, Boulder, Colorado
M Kopycinska-Müller
Affiliation:
National Institute of Standards and Technology, Boulder, Colorado
D C Hurley
Affiliation:
National Institute of Standards and Technology, Boulder, Colorado

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 364 - 365
Copyright
© 2005 Microscopy Society of America