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Wavelength-scale Coherent Diffractive Imaging using a High-order Harmonic Source

Published online by Cambridge University Press:  10 August 2018

W. Eschen ,
G.K. Tadesse ,
R. Klas ,
M. Tschernajew ,
F. Tuitje ,
V. Hilbert ,
D. Schelle ,
A. Nathanael ,
M. Zilk  and
M. Steinert
...Show all authors
W. Eschen*
Affiliation:
Helmholtz-Institute Jena, Frobelstieg 3, 07743 Jena, Germany Institute of Applied Physics, Abbe Center of Photonics, Friedrich-Schiller-University Jena, Albert-Ein-stein-StraBe 15, 07745 Jena, Germany
G.K. Tadesse
Affiliation:
Helmholtz-Institute Jena, Frobelstieg 3, 07743 Jena, Germany Institute of Applied Physics, Abbe Center of Photonics, Friedrich-Schiller-University Jena, Albert-Ein-stein-StraBe 15, 07745 Jena, Germany
R. Klas
Affiliation:
Helmholtz-Institute Jena, Frobelstieg 3, 07743 Jena, Germany Institute of Applied Physics, Abbe Center of Photonics, Friedrich-Schiller-University Jena, Albert-Ein-stein-StraBe 15, 07745 Jena, Germany
M. Tschernajew
Affiliation:
Institute of Applied Physics, Abbe Center of Photonics, Friedrich-Schiller-University Jena, Albert-Ein-stein-StraBe 15, 07745 Jena, Germany
F. Tuitje
Affiliation:
Helmholtz-Institute Jena, Frobelstieg 3, 07743 Jena, Germany Institute of Optics and Quantum Electronics, Friedrich-Schiller-University Jena, Max-Wien-Platz 1, 07743 Jena, Germany
V. Hilbert
Affiliation:
Institute of Applied Physics, Abbe Center of Photonics, Friedrich-Schiller-University Jena, Albert-Ein-stein-StraBe 15, 07745 Jena, Germany
D. Schelle
Affiliation:
Institute of Applied Physics, Abbe Center of Photonics, Friedrich-Schiller-University Jena, Albert-Ein-stein-StraBe 15, 07745 Jena, Germany
A. Nathanael
Affiliation:
Institute of Applied Physics, Abbe Center of Photonics, Friedrich-Schiller-University Jena, Albert-Ein-stein-StraBe 15, 07745 Jena, Germany
M. Zilk
Affiliation:
Institute of Applied Physics, Abbe Center of Photonics, Friedrich-Schiller-University Jena, Albert-Ein-stein-StraBe 15, 07745 Jena, Germany
M. Steinert
Affiliation:
Institute of Applied Physics, Abbe Center of Photonics, Friedrich-Schiller-University Jena, Albert-Ein-stein-StraBe 15, 07745 Jena, Germany
F. Schrempel
Affiliation:
Institute of Applied Physics, Abbe Center of Photonics, Friedrich-Schiller-University Jena, Albert-Ein-stein-StraBe 15, 07745 Jena, Germany
C. Spielmann
Affiliation:
Helmholtz-Institute Jena, Frobelstieg 3, 07743 Jena, Germany Institute of Optics and Quantum Electronics, Friedrich-Schiller-University Jena, Max-Wien-Platz 1, 07743 Jena, Germany
T. Pertsch
Affiliation:
Institute of Applied Physics, Abbe Center of Photonics, Friedrich-Schiller-University Jena, Albert-Ein-stein-StraBe 15, 07745 Jena, Germany Fraunhofer Institute for Applied Optics and Precision Engineering, Albert-Einstein-Str. 7, 07745 Jena, Germany
A. Tunnermann
Affiliation:
Helmholtz-Institute Jena, Frobelstieg 3, 07743 Jena, Germany Institute of Applied Physics, Abbe Center of Photonics, Friedrich-Schiller-University Jena, Albert-Ein-stein-StraBe 15, 07745 Jena, Germany Fraunhofer Institute for Applied Optics and Precision Engineering, Albert-Einstein-Str. 7, 07745 Jena, Germany
J. Limpert
Affiliation:
Helmholtz-Institute Jena, Frobelstieg 3, 07743 Jena, Germany Institute of Applied Physics, Abbe Center of Photonics, Friedrich-Schiller-University Jena, Albert-Ein-stein-StraBe 15, 07745 Jena, Germany Fraunhofer Institute for Applied Optics and Precision Engineering, Albert-Einstein-Str. 7, 07745 Jena, Germany
J. Rothhardt
Affiliation:
Helmholtz-Institute Jena, Frobelstieg 3, 07743 Jena, Germany Institute of Applied Physics, Abbe Center of Photonics, Friedrich-Schiller-University Jena, Albert-Ein-stein-StraBe 15, 07745 Jena, Germany
*
*Corresponding author: [email protected]

Abstract

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Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 16 - 17
Copyright
© Microscopy Society of America 2018 

References

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