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The Utility of TEM and AFM Techniques in the Preclinical Assessment of Nanomaterials

Published online by Cambridge University Press:  01 August 2010

J Zheng ,
D Parmiter ,
L Graham ,
K Nagashima ,
AK Patri  and
SE McNeil
J Zheng
Affiliation:
SAIC-Frederick, Inc.
D Parmiter
Affiliation:
SAIC-Frederick, Inc.
L Graham
Affiliation:
SAIC-Frederick, Inc.
K Nagashima
Affiliation:
SAIC-Frederick, Inc.
AK Patri
Affiliation:
SAIC-Frederick, Inc.
SE McNeil
Affiliation:
SAIC-Frederick, Inc.

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1940 - 1941
Copyright
Copyright © Microscopy Society of America 2010