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User Access to Lorentz Microscopy at the NCEM, LBNL, Berkeley.

Published online by Cambridge University Press:  02 July 2020

K. Verbist ,
C. Nelson  and
K. Krishnan
K. Verbist
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory ,Berkeley, CA, USA
C. Nelson
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory ,Berkeley, CA, USA
K. Krishnan
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory ,Berkeley, CA, USA
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Extract

A standard Philips CM200FEG electron microscope, without the special Lorentz lens, has been optimized for Lorentz imaging. The necessary field-free sample region is obtained by switching off the objective lens in the free lens mode. The limited range of magnification is compensated for by a post-column Gatan image filter (GIF) which magnifies by a factor of _ 20. Fresnel imaging is performed by defocusing with the diffraction lens. The use of low angle diffraction, in combination with the apertures located at the selected area aperture plane, allow Foucault imaging. The TEM analog of differential phase contrast (DPC) imaging has been implemented. This method makes it possible to obtain quantitave induction maps of the in-plane magnetization. TEM DPC is based on a series of Foucault images, recorded with different incremental beam tilts, which are processed to yield images equivalent to the quadrant signals obtained by the STEM DPC technique.

Type
Shared Resources and User Facilities: Access to Instrumentation
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 472 - 473
Copyright
Copyright © Microscopy Society of America

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References

References:

1.Daykin, A. C., Petford-Long, A. K., Ultramicroscopy 58 (1995) 365–380CrossRefGoogle Scholar
2.Chapman, J. N., Ploessl, R., Donnet, D. M., Ultramicroscopy 47 (1992) 331–338CrossRefGoogle Scholar
3.Dooley, J., De Graef, M., Ultramicroscopy 67 (1997) 113–131CrossRefGoogle Scholar
4. This work was supported by the Director, Office of Energy Research, Office of Basic Energy Sciences, Materials Sciences Division of the U.S. Department of Energy under contract No. DEAC03- 76SF00098.Google Scholar