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The Use of Energy Dispersive X-Ray Microanalysis in the Geological Sciences: 30 Years of Heavy and Creative Application

Published online by Cambridge University Press:  02 July 2020

John T. Armstrong*
Affiliation:
Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD, 20899
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Extract

Considering the heavy use by the geological community that followed, it is not surprising that first two authors of the introductory paper in Science on the energy dispersive x-ray spectrometer applied their x-ray microanalysis skills predominantly in the geological sciences. The energy dispersive spectrometer became first commercially available at an ideal time for the geological community. During the 1960’s, mineralogists and petrographers like K. Keil, J.V.P. Long, J.C. Rucklidge, J.V. Smith, A. Albee, and A. Chodos demonstrated that electron microprobe analysis with wavelength dispersive spectrometers could provide accurate in-situ analysis of portions of individual mineral grains on a scale not readily obtainable by other techniques (e.g., 2-3 and cited refs.). The electron microprobe enabled analysis of features observed by reflected- and transmitted-light polarized optical microscopy (prime tools of the mineralogist and petrographer) and was beginning to be used routinely for the study of meteorites and terrestrial rocks and even more exotic types of specimens, like individual microparticles from sediment and airborne particulate samples.

Type
30 Years of Energy Dispersive Spectrometry in Microanalysis
Copyright
Copyright © Microscopy Society of America

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References

1.Fitzgerald, R., Keil, K., and Heinrich, K. F. J., Science 159 (1968) 528.CrossRefGoogle Scholar
2.Keil, K., Fortschr. Mineral. 44 (1967) 4.Google Scholar
3.Smith, D. G. W., Ed., Mineralogical Society of Canada Short Course in Microbeam Techniques, 1 Edmonton Co-op Press (1976) 186 pp.Google Scholar
4.Reed, S. J. B., Electron microprobe analysis and scanning electron microscopy in geology, Cambridge University Press (1996) 201 pp.Google Scholar
5.Bence, A. E. and Albee, A. A., J. Geol, 76 (1968) 382.CrossRefGoogle Scholar
6.Armstrong, J. T., In: Electron Probe Quantitation, Heinrich, K. F. J. and Newbury, D. E., Eds., Plenum Press (1991) 261.CrossRefGoogle Scholar