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Use of Electron Backscatter Diffraction Technique in Characterization of 6XXX Aluminum Alloy Extrusions

Published online by Cambridge University Press:  02 July 2020

Steven R. Claves ,
Wojciech Z. Misiolek ,
William H. Van Geertruyden  and
David B. Williams
Steven R. Claves
Affiliation:
Department of Materials Science and Engineering Lehigh University, Bethlehem, Pennsylvania, 18015, USA
Wojciech Z. Misiolek
Affiliation:
Department of Materials Science and Engineering Lehigh University, Bethlehem, Pennsylvania, 18015, USA
William H. Van Geertruyden
Affiliation:
Department of Materials Science and Engineering Lehigh University, Bethlehem, Pennsylvania, 18015, USA
David B. Williams
Affiliation:
Department of Materials Science and Engineering Lehigh University, Bethlehem, Pennsylvania, 18015, USA
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Extract

Electron Backscattering Diffraction (EBSD) is an important tool for analyzing the crystal grain orientation of a microstructure and can be used to formulate conclusions about microtexture, texture determined from individual grains. This technique has been used to study a 6xxx series aluminum alloy's response to the deformation of the extrusion process. Extrusion is the process by which a billet of material is forced, under high pressure, through a die. The material undergoes a significant decrease in cross sectional area, and is formed into a shape equivalent to the geometry of the die orifice. Different bearing lands are shown in shown in Figure 1. These surfaces form the part, and are designed to control the metal flow making it uniform through the die, thus yielding good mechanical properties. This research was focused on the resultant microstructure. The shaded regions of Figure 2 show the two surface regions where EBSD measurements were taken.

Type
Advances in the Instrumentation and Application of Electron Backscatter Diffraction in the SEM
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 954 - 955
Copyright
Copyright © Microscopy Society of America

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References

References:

1.Trogolo, J.A., Kelly, R.M., Misiolek, W.Z., Use of EBSD Technique for Microstructure Characterization of the Deformation Zone in Aluminum Extrusion, Proceedings of the 6th International Aluminum Extrusion Technology Seminar ET'96, Chicago, IL, (1996), vol. I, 217–221.Google Scholar
2.Humphreys, F. J., Quantitative Metallography By Electron Backscattered Diffraction, Journal of Microscopy, Vol. 195, (1999), p. 172.CrossRefGoogle ScholarPubMed