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Unexpected Bismuth Concentration Profiles in MOVPE GaAs1-xBix Films Revealed by HAADF STEM Imaging

Published online by Cambridge University Press:  27 August 2014

A. W. Wood ,
Yingxin Guan ,
K. Forghani ,
L.J. Mawst ,
T. F. Kuech  and
S. E. Babcock
A. W. Wood
Affiliation:
Materials Science and Engineering, University of Wisconsin – Madison, United States
Yingxin Guan
Affiliation:
Materials Science and Engineering, University of Wisconsin – Madison, United States
K. Forghani
Affiliation:
Chemical and Biological Engineering, University of Wisconsin – Madison, United States
L.J. Mawst
Affiliation:
Electrical and Computer Engineering, University of Wisconsin – Madison, United States
T. F. Kuech
Affiliation:
Chemical and Biological Engineering, University of Wisconsin – Madison, United States
S. E. Babcock
Affiliation:
Materials Science and Engineering, University of Wisconsin – Madison, United States

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 196 - 197
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Forghani, K., et al, J. Cryst. Growth 380 (2013) 23.Google Scholar
[2] Williams, D. B.and Carter, C. B. in “Transmission Electron Microscopy” (Plenum Press, New York).Google Scholar