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Understanding Radiation Damage in Beam-Sensitive TEM Specimens

Published online by Cambridge University Press:  30 July 2020

Ray Egerton
Ray Egerton*
Affiliation:
Department of Physics, University of Alberta, Edmonton, Alberta, Canada

Abstract

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Type
Structural Changes in Hard, Soft, and Biological Samples During Imaging: From Transmission Electron to Helium Ion Microscopy
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 84 - 86
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Copyright
Copyright © Microscopy Society of America 2020

References

Egerton, R.F., Microscopy Res. & Technique 75, 1550 (2012).10.1002/jemt.22099CrossRefGoogle Scholar
Egerton, R.F., Micron 119, 72 (2019). https://doi.org/10.1016/j.micron.2019.01.005CrossRefGoogle Scholar
Peng, L.-M., Acta Cryst. A52, 456 (1996).10.1107/S010876739600089XCrossRefGoogle Scholar
Chamberlain, T.W. et al. , Small (2014) doi: 10.1002/smll.201402081Google Scholar
Reimer, L. and Kohl, H., Transmission Electron Microscopy (Springer, 2008), p.477.Google Scholar
Glaeser, R.W., Methods in Enzmyology 579, 19 (2016). ISSN 0076-687910.1016/bs.mie.2016.04.010CrossRefGoogle Scholar
Lin, B.J., J. Vac. Sci. Technol. 12, 1317 (1975).10.1116/1.568527CrossRefGoogle Scholar
Hobbs, L.W., Ultramicroscopy 3, 381 (1979).10.1016/S0304-3991(78)80058-8CrossRefGoogle Scholar
Barr, L.W. et al. , J. Appl. Phys. 36, 624 (1965).10.1063/1.1714040CrossRefGoogle Scholar
Egerton, R.F. and Qian, H., Microsc. Microanal. 25 (Suppl. 2), 992 (2019).10.1017/S1431927619005695CrossRefGoogle Scholar
Egerton, R.F., Adv. Struct. Chem. Imag. 1, 5 (2015) doi: 10.1186/s40679-014-0001-3CrossRefGoogle Scholar