Hostname: page-component-cd9895bd7-8ctnn Total loading time: 0 Render date: 2024-12-27T11:13:10.323Z Has data issue: false hasContentIssue false
  • English
  • Français

(Under)Graduate Teaching Using Internet Access to Electron Microscopes

Published online by Cambridge University Press:  02 July 2020

E. Voelkl ,
L.F. Allard ,
J. Bruley  and
D. B. Williams
E. Voelkl
Affiliation:
High Temperature Materials Laboratory, Oak Ridge National Laboratory, Oak Ridge, TN37831
L.F. Allard
Affiliation:
High Temperature Materials Laboratory, Oak Ridge National Laboratory, Oak Ridge, TN37831
J. Bruley
Affiliation:
Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA18015
D. B. Williams
Affiliation:
Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA18015
Get access

Extract

The Lehigh University is presently offering direct access to top of the line electron microscopes at ORNL via the Internet for one graduate and one undergraduate course (Advanced TEM, Electron Microscopy & Microanalysis). The students at Lehigh have the opportunity to themselves control the Hitach HF-2000 FEG TEM. The controls presently include change of magnification and focus, moving the sample and correction for astigmatism. In this way, the students can collect high resolution lattice images of various materials and study e.g., the effects of changing focus on lattice images (contrast reversal). While the students at Lehigh can sit in the class room and run the instrument in broad daylight and communicate freely without disturbing the instrument by phonics, the instrument itself is protected from misuse through several layers of hardware and software.

This new way of teaching EM courses has become possible through recent advances in computer hardware (live-time Fourier transforms (FFTs)) and software. A commercial software package TimbuktuPro provides remote access to the computer at the HF-2000 at ORNL which controls the instrument as well as the slow-scan CCD-cameras (Gatan, model 794) attached to the instrument.

Type
Digital Microscopy–What are its Limits?
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 1095 - 1096
Copyright
Copyright © Microscopy Society of America 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Farallon Computing Inc., Alameda, CA 94501-1010, USAGoogle Scholar
2. Gatan Inc., Owens Drive, Pleasanton CA 27822, USAGoogle Scholar
3. CU-SeeMe (v0.83b3) available via FTP from: ‘cu-seeme.cornell.edu/pub/cu-seeme’.Google Scholar
4. Connectix, 2600 Campus Drive, San Mateo, CA 94403.Google Scholar
5.Voelkl, E., Allard, L.F., Nolan, T.A., Hill, D. and Lehmann, M., Scanning, Vol 19, in printGoogle Scholar
6. Research sponsored by the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory, managed for the Department of Energy by Lockheed Martin Energy Research Corp., under contract DE-AC05-96OR22464.Google Scholar