Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-25T09:27:08.657Z Has data issue: false hasContentIssue false
  • English
  • Français

Uncovering Atomic and Nano-scale Deformations in Two-dimensional Lateral Heterojunctions

Published online by Cambridge University Press:  30 July 2020

Yimo Han ,
David Muller ,
Saien Xie ,
Jiwoong Park ,
Ming-Yang Li  and
Lain-Jong Li
Yimo Han
Affiliation:
Rice University, Houston, Texas, United States
David Muller
Affiliation:
Cornell University, Ithaca, New York, United States
Saien Xie
Affiliation:
University of Chicago, Ithaca, New York, United States
Jiwoong Park
Affiliation:
University of Chicago, Chicago, Illinois, United States
Ming-Yang Li
Affiliation:
King Abdullah University of Science and Technology, Thuwal, Al Bahah, Saudi Arabia
Lain-Jong Li
Affiliation:
The University of New South Wales, New South Wales, New South Wales, Australia

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
New Frontiers in Electron Microscopy of Two-dimensional Materials
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1630 - 1631
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Han, Y. et al. Nano Letters, 18 (2018), p. 3746–3751.10.1021/acs.nanolett.8b00952CrossRefGoogle Scholar
Tate, M. W. et al. , Microscopy and Microanalysis 22 (2016), p. 237–249.10.1017/S1431927615015664CrossRefGoogle Scholar
Han, Y. et al. Nature Materials 17 (2018), p. 129–133.10.1038/nmat5038CrossRefGoogle Scholar
Zhang, C. et al. Nature Nanotechnology 13 (2018), p. 152–158.10.1038/s41565-017-0022-xCrossRefGoogle Scholar
Xie, S. et al. Science 359 (2018), p. 1131–1136.10.1126/science.aao5360CrossRefGoogle Scholar
Funded by the Cornell Center for Materials Research, an NSF MRSEC (DMR-1719875).Google Scholar
Y.H. is supported by the Dean for Research Innovation Fund for New Ideas in the Natural Sciences from Princeton University.Google Scholar