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Ultra-High Vacuum Aberration-Corrected STEM for in-situ studies

Published online by Cambridge University Press:  25 July 2016

M.T. Hotz ,
G.J. Corbin ,
N. Dellby ,
O.L. Krivanek ,
C. Mangier  and
J.C. Meyer
M.T. Hotz
Affiliation:
Nion Co., 11511 NE 118th St., Kirkland, WA 98034, USA
G.J. Corbin
Affiliation:
Nion Co., 11511 NE 118th St., Kirkland, WA 98034, USA
N. Dellby
Affiliation:
Nion Co., 11511 NE 118th St., Kirkland, WA 98034, USA
O.L. Krivanek
Affiliation:
Nion Co., 11511 NE 118th St., Kirkland, WA 98034, USA
C. Mangier
Affiliation:
Dept. of Physics, University of Vienna, Boltzmanngasse 5, 1090 Vienna, Austria
J.C. Meyer
Affiliation:
Dept. of Physics, University of Vienna, Boltzmanngasse 5, 1090 Vienna, Austria

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 34 - 35
Copyright
© Microscopy Society of America 2016 

References

1. Krivanek, O.L., et al, Nature 464 (2010) 571.Google Scholar
2. Lovejoy, T.C., et al, Appl. Phys. Lett 100 (2012) 154101.Google Scholar
3. Zhou, W., et al, PRL 109 (2012) 206803; Q.M. Ramasse et al. Nano Lett. 13 (2013) 4989.Google Scholar
4. Lin, Y.-C., et al, PRL 115 (2015) 206803.Google Scholar
5. Krivanek, O.L., et al, Ultramicroscopy 108 (2008) 179.Google Scholar
6. http://www.dme-spm.com/special.html.Google Scholar