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Ultrafast Electron Diffraction and Microscopy: Why We Should Know About Transient Electric Fields and Where They Come From

Published online by Cambridge University Press:  01 August 2010

H Park  and
J-M Zuo
H Park
Affiliation:
University of Illinois, Urbana Champaign
J-M Zuo
Affiliation:
University of Illinois, Urbana Champaign

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 496 - 497
Copyright
Copyright © Microscopy Society of America 2010