Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-28T15:52:54.069Z Has data issue: false hasContentIssue false
  • English
  • Français

Two-Photon Microscopy of Single Molecules

Published online by Cambridge University Press:  02 July 2020

J. T. Fourkas ,
M. J. R. Previte ,
R. A. Farrer ,
C. Olson  and
L. A. Peyser
J. T. Fourkas
Affiliation:
Eugene F. Merkert Chemistry Center, Boston College, Chestnut Hill, MA, 02467
M. J. R. Previte
Affiliation:
Eugene F. Merkert Chemistry Center, Boston College, Chestnut Hill, MA, 02467
R. A. Farrer
Affiliation:
Eugene F. Merkert Chemistry Center, Boston College, Chestnut Hill, MA, 02467
C. Olson
Affiliation:
Eugene F. Merkert Chemistry Center, Boston College, Chestnut Hill, MA, 02467
L. A. Peyser
Affiliation:
Eugene F. Merkert Chemistry Center, Boston College, Chestnut Hill, MA, 02467
Get access

Extract

The ability to observe the fluorescence arising from single molecules has revolutionized our ability to study the structure and dynamics of materials on a microscopic level and to probe the properties of individual members of a heterogeneous ensemble. A variety of near-field and far-field excitation techniques have been employed to study single molecules. Multiphoton excitation (MPE) techniques have a number of advantages that make them particularly attractive for singlemolecule detection. First, because the excitation and fluorescence wavelengths are significantly different from one another, Rayleigh and Raman scattering can easily be filtered out, leading to a low number of background counts. Second, because the probability for MPE depends on the excitation intensity to the second or higher power, the excitation is localized to the point in space where the excitation beam is most tightly focussed, thus providing three-dimensional resolution.

Type
Advances in Multi-Photon imaging
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 802 - 803
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

References:

1.Moerner, W. E. and Orrit, M.. Science 283(1999)1670.CrossRefGoogle Scholar
2.Mertz, J., Xu, C. and Webb, W. W.. Opt. Lett. 20( 1995)2532.CrossRefGoogle Scholar
3.Sanchez, E. J., Novotny, L., Holtom, G. R. and Xie, X. S.. J. Phys. Chem. A 101(1997)7019.CrossRefGoogle Scholar
4.Lewis, M. K., Wolanin, P., Gafni, A. and Steel, D. G.. Opt. Lett. 23(1998)1111.CrossRefGoogle Scholar
5.Sonnleitner, M., Schutz, G. J. and Schmidt, T.. Chem. Phys. Lett. 300(1999)221.CrossRefGoogle Scholar
6.Farrer, R. A., Previte, M. J. R., Olson, C. E., Peyser, L. A., Fourkas, J. T. and P. T. C. So. Opt. Lett. 24(1999)1832.CrossRefGoogle Scholar