Hostname: page-component-cd9895bd7-q99xh Total loading time: 0 Render date: 2024-12-27T13:03:25.790Z Has data issue: false hasContentIssue false
  • English
  • Français

Turn-Key Compressed Sensing System for Electron Microscopy

Published online by Cambridge University Press:  22 July 2022

E.L. Principe ,
J.J. Hagen ,
B.W. Kempshall ,
K.E. Scammon ,
Z. Russel ,
M. Therezien ,
T. McIntee ,
S. DiDona  and
A. Stevens
E.L. Principe*
Affiliation:
Synchrotron Research, Inc., Melbourne Beach, Florida, USA
J.J. Hagen
Affiliation:
Synchrotron Research, Inc., Melbourne Beach, Florida, USA
B.W. Kempshall
Affiliation:
PanoScientific, LLC 2, Cocoa, Florida, USA
K.E. Scammon
Affiliation:
PanoScientific, LLC 2, Cocoa, Florida, USA
Z. Russel
Affiliation:
Ion Innovations3, Boone, North Carolina, USA
M. Therezien
Affiliation:
Ion Innovations3, Boone, North Carolina, USA
T. McIntee
Affiliation:
Ion Innovations3, Boone, North Carolina, USA
S. DiDona
Affiliation:
Ion Innovations3, Boone, North Carolina, USA
A. Stevens
Affiliation:
Optimal Sensing, Southlake, Texas, USA
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2516 - 2518
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

SB1341-15-CN-0050, SB1341-16-SE-0203, SB1341-17-CN-0029Google Scholar
Anderson, , et al. , Computational Imaging X1. Proceedings of SPI-IS&T Electronic Imaging, SPIE. 8675 (2013).Google Scholar
Kovarik, L. et al. , Appl. Phys. Lett. 109 (2016), p. 164102. https://doi.org/10.1063/1.4965720.CrossRefGoogle Scholar