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Truly Quantitative EELS Imaging - Let’s Not Settle For Just Pretty Pictures Anymore

Published online by Cambridge University Press:  02 July 2020

John A. Hunt
John A. Hunt*
Affiliation:
Gatan Research & Development, 5933 Coronado Lane, Pleasanton, CA, 94588, USA
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Abstract

The term “quantitative“ means many things to many people. in imaging its value is often discounted to mean only that a more intense region can be said to have more of what is being measured than a less intense region. Others may be more stringent and require an approximately linear relationship between the measured property and image intensity. (This is most often the case in EFTEM and spectrum imaging) Some specimens contain internal references (such as elements with a known stoichiometric relationship) that are sufficient to get to a true concentration calibration for an image. However, in EELS imaging this still doesn’t allow us to get an understanding of our errors and rarely is it helpful in determining detection or quantification limits.

A competent high-school chemistry or physics student could tell us that a quantitative measurement includes both a measured value and an estimate of its error.

Type
EELS Microanalysis At High Sensitivity: Advances in Spectrum Imaging, Energy Filtering and Detection (Organized by R. Leapman and J. Bruley)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 1142 - 1143
Copyright
Copyright © Microscopy Society of America 2001

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References

1. Currie, L.A., Anal. Chem. 40 (1968) 586.CrossRefGoogle Scholar

2. Hunt, J.A., and Williams, D.B. (1991), Ultramicr. 38, 47–73.CrossRefGoogle Scholar

3. Swyt, C.R., X-Ray Spectrometry in Electron Beam Instruments, ed. Williams, D.B., Goldstein, J.I., Newbury, D.E., Plenum Press (1995) 159–166.CrossRefGoogle Scholar