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Transmission-EBSD Using High Current Electron Beams

Published online by Cambridge University Press:  25 July 2016

Majid Abbasi ,
Dong-Ik Kim ,
Hwan-Uk Guim  and
Woo-Sang Jung
Majid Abbasi*
Affiliation:
High Temperature Energy Materials Research Center, Korea Institute of Science and Technology (KIST), Seoul 136-791, Republic of Korea
Dong-Ik Kim
Affiliation:
High Temperature Energy Materials Research Center, Korea Institute of Science and Technology (KIST), Seoul 136-791, Republic of Korea
Hwan-Uk Guim
Affiliation:
Nano-Bio Electron Microscopy Research Team, Korea Basic Science Institute (KBSI), Daejeon 305-333, Republic of Korea
Woo-Sang Jung
Affiliation:
High Temperature Energy Materials Research Center, Korea Institute of Science and Technology (KIST), Seoul 136-791, Republic of Korea
*
*[email protected], Phone: (+82) 10-8946-8873 Fax: (+82) 2-958-5449

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1652 - 1653
Copyright
© Microscopy Society of America 2016 

References

[1] Geiss, R.H., Keller, R.R. & Read, D.T. Microsc. Microanal 16 (2010). pp. 1742–1743.CrossRefGoogle Scholar
[2] Brodusch, N., Demers, H., Trudeau, M., etal, Scanning 35 (2013). pp. 375–386.Google Scholar
[3] Geiss, R.H. Microsc. Microanal 21 (2015). pp. 1249–1250.Google Scholar
[4] Trimby, P.W. Ultramicroscopy 120 (2012). pp. 16–24.CrossRefGoogle Scholar
[5] Fundenberger, J.J., Bouzy, E., Goran, D., et al, Ultramicroscopy, In-press. DOI: 10.1016/j.ultramic.2015.11.002.Google Scholar
[6] Abbasi, M., Kim, D.I., Guim, H.U., et al, ACS Nano 9 (2015). pp. 10991–11002.Google Scholar
[7] Goran, D., et al, Royal Microscopy Society Proceedings (2015) Glasgow, UK.Google Scholar
[8] Wang, Z.L. Micron 34 (2003) 141–155.Google Scholar
[9] Bremen, R.V., Gomes, D.R., Jeer, L.T.H.D., et al, Ultramicroscopy 160 (2016). pp. 256–264.CrossRefGoogle Scholar
[10] Hong, S.H., Phaniraj, M.P., Kim, D.I., et al, Electrochem. Solid State Lett 13 (2010). pp. 40–42.CrossRefGoogle Scholar
[11] The authors gratefully acknowledge the financial support by KIST (2E25322) and the New & Renewable Energy R&D program (20113020030020), Ministry of Knowledge Economy, Rep. of Korea.Google Scholar