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Trace Element Analysis in Geochemical Systems by STEM\EDS

Published online by Cambridge University Press:  27 August 2014

Z. Gainsforth ,
K. Bustillo ,
A. L. Butterworth ,
R. C. Ogliore  and
A. J. Westphal
Z. Gainsforth
Affiliation:
Space Sciences Laboratory, University of California Berkeley, 7 Gauss Way, Berkeley, CA, 94720
K. Bustillo
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley Laboratory, MS 72-150, Berkeley, CA, 94720
A. L. Butterworth
Affiliation:
Space Sciences Laboratory, University of California Berkeley, 7 Gauss Way, Berkeley, CA, 94720
R. C. Ogliore
Affiliation:
Hawai‘i Institute of Geophysics and Planetology, University of Hawai‘i at Manoa, Honolulu, HI 96822
A. J. Westphal
Affiliation:
Space Sciences Laboratory, University of California Berkeley, 7 Gauss Way, Berkeley, CA, 94720

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1682 - 1683
Copyright
Copyright © Microscopy Society of America 2014 

References

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[3] Ogliore, R. C., et al., 43rd Lunar and Planetary Sciences Conference (2012).Google Scholar
[4] Gainsforth, Z., et al., 44th Lunar and Planetary Sciences Conference (2013).Google Scholar
[5] Gainsforth, Z., et al., 45th Lunar and Planetary Sciences Conference (2014).Google Scholar
[6] Flynn, G. J., et al., Meteoritics and Planetary Science 35 (2000): 54.Google Scholar
[7] The operations of the National Center for Electron Microscopy at Lawrence Berkeley National Laboratory are supported by the Director, Office of Science, Office of Basic Energy Sciences, U.S. Department of Energy under contract number DE-AC02-05CH11231.Google Scholar