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Towards Property Nanomeasurments By In-Situ TEM

Published online by Cambridge University Press:  02 July 2020

Z.L. Wang ,
R.P. Gao ,
Z.G. Bai ,
Z.R. Dai ,
P. Poncharal  and
W.A. de Heer
Z.L. Wang
Affiliation:
School of Materials Science and Engineering, Georgia Institute of Technology Atlanta, GA30332
R.P. Gao
Affiliation:
School of Materials Science and Engineering, Georgia Institute of Technology Atlanta, GA30332
Z.G. Bai
Affiliation:
School of Materials Science and Engineering, Georgia Institute of Technology Atlanta, GA30332
Z.R. Dai
Affiliation:
School of Materials Science and Engineering, Georgia Institute of Technology Atlanta, GA30332
P. Poncharal
Affiliation:
School of Physics, Georgia Institute of Technology Atlanta, GA30332
W.A. de Heer
Affiliation:
School of Physics, Georgia Institute of Technology Atlanta, GA30332
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Extract

Characterizing the physical properties of individual nanostructures is rather challenging because of the difficulty in manipulating the objects of sizes from nanometer to micrometer. Most of the nanomeasurements have been carried using STM and AFM. In this presentation, we demonstrate that transmission electron microscopy can be a powerful tool for quantitative measurements the mechanical, electrical and thermodynamic properties of a single nanostructure, such as a carbon nanotube or a nanoparticle.

Using a customer-built specimen holder, in-situ measurements on the mechanical properties of carbon nanotubes has been carried out using the resonance phenomenon induced by an externally applied alternating voltage [1]. If an oscillating voltage is applied on the nanotube with tunable frequency, resonance can be induced (Fig. 1). The bending modulus is calculated from the resonance frequency. The bending modulus is as high as 1.2 TPa (as strong as diamond) for nanotubes with diameters smaller than 8 nm, and it drops to as low as 0.2 TPa for those with diameters larger than 30 nm.

Type
Sir John Meurig Thomas Symposium: Microscopy and Microanalysis in the Chemical Sciences
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 64 - 65
Copyright
Copyright © Microscopy Society of America

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References

[1]Poncharal, P., Wang, Z.L., Ugarte, D. and de Heer, W.A., Science, 283 (1999) 1513.CrossRefGoogle Scholar
[2]Frank, S., Poncharal, P., Wang, Z.L., and de Heer, W.A., Science, 280 (1998) 1744.CrossRefGoogle Scholar
[3] Research supported by NSF DMR-9971412 and DMR-9733160.Google Scholar